Go to GlobalSpec.com Home

Veeco Instruments Data Sheets for Product and Material Test Fixtures and Accessories

Veeco Instruments
Address: Terminal Drive
Plainview, NY 11803
 Contact: Web site
E-mail

Phone:  (805) 967-1400
(888) 248-3326
Fax: (805) 967-7717

Product and Material Test Fixtures and Accessories:

Material test fixtures and accessories include mechanical testing grips, fixtures, sample heaters, extensometers, specimen cutters, and other specialized test components.

Product and Material Test Fixtures and Accessories: Learn more
Page: 1 2

Product Name
Notes
Silicon Probes -- NCHV, Silicon Probes -- NCHV-A, Silicon Probes -- NCHV-AW, Silicon Probes -- NCHV-W, Silicon Probes -- NCLV, Silicon Probes -- NCLV-W Advantage line metrology probe, 25 degree front angle, anisotropic geometry
Silicon Nitride Probes -- OBL-105, Silicon Nitride Probes -- OBL-210, Silicon Nitride Probes -- OBL-35 Biolever probe, 0 degree front angle, anisotropic geometry
Magnetic Probes -- MSNC-MFMT-A, Magnetic Probes -- MSNC-MFMT-B, Magnetic Probes -- MSNC-MFNM Cobalt coated, 35 degree front angle, cast geometry
Magnetic Probes -- 1670-00, Magnetic Probes -- MESP, Magnetic Probes -- MESP-CPMT, Magnetic Probes -- MESP-HM, Magnetic Probes -- MESP-HMW, Magnetic Probes -- MESP-LM, Magnetic Probes -- MESP-LMW, Magnetic Probes -- MESPW Cobalt/Chrome coated, 25 degree front angle, anisotropic geometry
Hardened Probes -- BESP, Hardened Probes -- BESPW Cobalt/Chrome coated, 25 degree front angle, for non-magnetic samples
Magnetic Probes -- MESPSP Cobalt/chrome/iron coated, 25 degree front angle, anisotropic geometry
Silicon Probes -- MPP-32100-10, Silicon Probes -- MPP-32120-10 Cont10 metrology probe, 15 degree front angle, anisotropic geometry
Silicon Probes -- MPP-32200-10, Silicon Probes -- MPP-32220-10 Cont10 metrology probe, 25 degree front angle, anisotropic geometry
Silicon Probes -- MPP-31100-10, Silicon Probes -- MPP-31100-W, Silicon Probes -- MPP-31120-10, Silicon Probes -- MPP-31120-10, Silicon Probes -- MPP-31120-W Cont20 metrology probe, 15 degree front angle, anisotropic geometry
Silicon Probes -- MPP-31200-10, Silicon Probes -- MPP-31200-W, Silicon Probes -- MPP-31220-10, Silicon Probes -- MPP-31220-W Cont20 metrology probe, 25 degree front angle, anisotropic geometry
Silicon Probes -- MPP-33100-10, Silicon Probes -- MPP-33100-W, Silicon Probes -- MPP-33120-10, Silicon Probes -- MPP-33120-W Cont40 metrology probe, 15 degree front angle, anisotropic geometry
Silicon Probes -- MPP-33200-10, Silicon Probes -- MPP-33200-W, Silicon Probes -- MPP-33220-10, Silicon Probes -- MPP-33220-W Cont40 metrology probe, 25 degree front angle, anisotropic geometry
Hardened Probes -- TESPD, Hardened Probes -- TESPDW DLC coated, 25 degree front angle, anisotropic geometry
Indentation Probes -- DNISP, Indentation Probes -- NICT-MTAP, Indentation Probes -- PDNISP, Indentation Probes -- PDNISP-R, Indentation Probes -- PDNISP-R2, Indentation Probes -- PDNISP-R3 Diamond tipped probe, 30 degree front angle, anisotropic geometry
High Aspect Ratio Probes -- DLCS Diamond-like carbon spike probe, 15 degree front angle, isotropic geometry
Electrical Probes -- MPP-11150-10, Electrical Probes -- MPP-11153-10, Electrical Probes -- MPP-21150-10, Electrical Probes -- MPP-21153-10 Doped diamond coated, 15 degree front angle, anisotropic geometry
Electrical Probes -- DDESP-10, Electrical Probes -- DDESP-FM-10 Doped diamond coated, 25 degree front angle, anisotropic geometry
Silicon Probes -- OLTESPA, Silicon Probes -- OLTESPAW, Silicon Probes -- OTESPA, Silicon Probes -- OTESPAW ESP series probe, 0 degree front angle, anisotropic geometry
Silicon Probes -- TESPA, Silicon Probes -- TESPAW ESP series probe, 25 degree front angle, anisotropic geometry
Automated 3-Degree Probes -- FIB3D2-100 FIB spike, ESP series probe, 1 degree front angle
Automated 13-Degree Probes -- FIB2-100 FIB spike, works with most Veeco microscope models, 1 degree front angle
Automated 13-Degree Probes -- FIB4-200 FIB spike, works with most Veeco microscope models, 1.2 degree front angle
Automated 13-Degree Probes -- FIB6-400 FIB spike, works with most Veeco microscope models, 1.7 degree front angle
Automated 13-Degree Probes -- FIB1-100, Automated 13-Degree Probes -- FIB8-600 FIB spike, works with most Veeco microscope models, 2 degree front angle
Magnetic Probes -- MESP-HR High resolution magnetic microscopy probes, 10 degree front angle
Magnetic Probes -- MESP-LC, Magnetic Probes -- MESP-LCW Iron coated, 25 degree front angle, anisotropic geometry
Magnetic Probes -- MADOTR4-10, Magnetic Probes -- MADOTR4-105, Magnetic Probes -- MADOTR4-35 Magnetic actuation, 36 degree front angle, cast geometry
Self Sensing/Actuating Probes -- DMASP, Self Sensing/Actuating Probes -- MPA-41200-10, Self Sensing/Actuating Probes -- MPA-41202-10, Self Sensing/Actuating Probes -- MPA-NP Micro-actuated silicon probe, 25 degree front angle, anisotropic geometry
Silicon Nitride Probes -- MLCT-AUHW, Silicon Nitride Probes -- MLCT-AUMT-A, Silicon Nitride Probes -- MLCT-AUMT-BF, Silicon Nitride Probes -- MLCT-AUNM, Silicon Nitride Probes -- MLCT-AUNM-10, Silicon Nitride Probes -- MLCT-ECEX-A, Silicon Nitride Probes -- MLCT-EXMT-A, Silicon Nitride Probes -- MLCT-EXMT-A-10, Silicon Nitride Probes -- MLCT-EXMT-BF, Silicon Nitride Probes -- MLCT-NOHW, Silicon Nitride Probes -- MLCT-NOMT-A, Silicon Nitride Probes -- MLCT-NOMT-BF, Silicon Nitride Probes -- MLCT-NONM, Silicon Nitride Probes -- MSCT-AUHW, Silicon Nitride Probes -- MSCT-AUMT-A, Silicon Nitride Probes -- MSCT-AUMT-BF, Silicon Nitride Probes -- MSCT-AUNM, Silicon Nitride Probes -- MSCT-AUNM-10, Silicon Nitride Probes -- MSCT-EXMT-A, Silicon Nitride Probes -- MSCT-EXMT-BF, Silicon Nitride Probes -- MSCT-NOHW, Silicon Nitride Probes -- MSCT-NOMT-A, Silicon Nitride Probes -- MSCT-NOMT-BF, Silicon Nitride Probes -- MSCT-NONM Microlever probes, 35 degree front angle, cast geometry
Silicon Probes -- RFESP, Silicon Probes -- RFESPW Multi75 metrology probe, 15 degree front angle, anisotropic geometry
Silicon Nitride Probes -- DNP, Silicon Nitride Probes -- DNP-1, Silicon Nitride Probes -- DNP-10, Silicon Nitride Probes -- DNP-20, Silicon Nitride Probes -- DNP-S, Silicon Nitride Probes -- DNP-S1, Silicon Nitride Probes -- DNP-S10, Silicon Nitride Probes -- DNP-S20, Silicon Nitride Probes -- NP, Silicon Nitride Probes -- NP-1, Silicon Nitride Probes -- NP-10, Silicon Nitride Probes -- NP-20, Silicon Nitride Probes -- NP-20-UC, Silicon Nitride Probes -- NP-S, Silicon Nitride Probes -- NP-S1, Silicon Nitride Probes -- NP-S10, Silicon Nitride Probes -- NP-S20, Silicon Nitride Probes -- NPG, Silicon Nitride Probes -- NPG-20 NP series probe, 35 degree front angle, cast geometry
Silicon Nitride Probes -- NP-STT, Silicon Nitride Probes -- NP-STT20 NP series probe, 36 degree front angle, cast geometry
NSOM Probes -- 1720-00, NSOM Probes -- 1730-00, NSOM Probes -- 1730-UV Near field scanning optical microscopy fiber, for Aurora and Lumina scopes
NSOM Probes -- 1640-00, NSOM Probes -- 1640-L1, NSOM Probes -- 1640-UC, NSOM Probes -- 1642-00, NSOM Probes -- 1642-UC Near field scanning optical microscopy probe
Electrical Probes -- OSCM-PT, Electrical Probes -- OSCM-PTW Platinum coated, 0 degree front angle, anisotropic geometry
Electrical Probes -- 1600-00, Electrical Probes -- SCM-PIC, Electrical Probes -- SCM-PICW, Electrical Probes -- SCM-PIT, Electrical Probes -- SCM-PITW, Electrical Probes -- SCSI-PTMT-CP Platinum/iridium coated, 25 degree front angle, anisotropic geometry
Automated 3-Degree Probes -- CDP200A, Automated 3-Degree Probes -- CDP55A Post probe, 0 degree front angle, works with Automated microscope
Silicon Probes -- 1650-00, Silicon Probes -- 1660-00, Silicon Probes -- 1950-00, Silicon Probes -- ESP, Silicon Probes -- ESPW, Silicon Probes -- FESP, Silicon Probes -- FESPW, Silicon Probes -- LTESP, Silicon Probes -- LTESPW, Silicon Probes -- TESP, Silicon Probes -- TESPW Premium line metrology probe, 25 degree front angle, anisotropic geometry
Silicon Nitride Probes -- ORC8-105, Silicon Nitride Probes -- ORC8-35, Silicon Nitride Probes -- ORC8-W RC series probe, 36 degree front angle, cast geometry
Automated 3-Degree Probes -- CDR120, Automated 3-Degree Probes -- CDR300, Automated 3-Degree Probes -- CDR70, Automated 3-Degree Probes -- CDR70S Round critical dimension probe, 10 degree front angle
Automated 3-Degree Probes -- CDR130SC, Automated 3-Degree Probes -- CDR130SIN, Automated 3-Degree Probes -- CDR850 Round critical dimension probe, 15 degree front angle
Force Calibration Cantilever -- CLFC-NOBO, Force Calibration Cantilever -- CLFC-NOMB Silicon, used as reference cantilever for spring constants of AFM probes
High Aspect Ratio Probes -- HAR1-200, High Aspect Ratio Probes -- TESP-HAR, High Aspect Ratio Probes -- TESPA-HAR Spike tip, 5 degree front angle, anisotropic geometry
Automated 3-Degree Probes -- CD100, Automated 3-Degree Probes -- CD130, Automated 3-Degree Probes -- CD75 Square critical dimension probe, 10 degree front angle
High Aspect Ratio Probes -- IBMSC Super cone probe, 10 degree front angle, isotropic geometry
High Aspect Ratio Probes -- TESP-SS, High Aspect Ratio Probes -- TESP-SSW Super sharp tip, 25 degree front angle, anisotropic geometry
Silicon Nitride Probes -- OTR4-105, Silicon Nitride Probes -- OTR4-35, Silicon Nitride Probes -- OTR4-W, Silicon Nitride Probes -- OTR8-105, Silicon Nitride Probes -- OTR8-35, Silicon Nitride Probes -- OTR8-W TR series probe, 36 degree front angle, cst geometry
Silicon Probes -- MPP-23100-10, Silicon Probes -- MPP-23100-W, Silicon Probes -- MPP-23120-10, Silicon Probes -- MPP-23120-W Tap130 metrology probe, 15 degree front angle, anisotropic geometry
Silicon Probes -- MPP-23200-10, Silicon Probes -- MPP-23200-W, Silicon Probes -- MPP-23220-10, Silicon Probes -- MPP-23220-W Tap130 metrology probe, 25 degree front angle, anisotropic geometry
Silicon Probes -- MPP-12100-10, Silicon Probes -- MPP-12100-W, Silicon Probes -- MPP-12120-10, Silicon Probes -- MPP-12120-W Tap150 metrology probe, 15 degree front angle, anisotropic geometry
Silicon Probes -- MPP-12200-10, Silicon Probes -- MPP-12200-W, Silicon Probes -- MPP-12220-10, Silicon Probes -- MPP-12220-W Tap150 metrology probe, 25 degree front angle, anisotropic geometry
Silicon Probes -- MPP-11100-10, Silicon Probes -- MPP-11100-W, Silicon Probes -- MPP-11120-10, Silicon Probes -- MPP-11120-W, Silicon Probes -- MPP-11123-10, Silicon Probes -- RTESP, Silicon Probes -- RTESPA, Silicon Probes -- RTESPAW, Silicon Probes -- RTESPW Tap300 metrology probe, 15 degree front angle, anisotropic geometry
Silicon Probes -- MPP-11200-10, Silicon Probes -- MPP-11200-W, Silicon Probes -- MPP-11220-10, Silicon Probes -- MPP-11220-W Tap300 metrology probe, 25 degree front angle, anisotropic geometry
Silicon Probes -- MPP-22100-10, Silicon Probes -- MPP-22100-W, Silicon Probes -- MPP-22120-10, Silicon Probes -- MPP-22120-W Tap40 metrology probe, 15 degree front angle, anisotropic geometry
Silicon Probes -- MPP-22200-10, Silicon Probes -- MPP-22200-W, Silicon Probes -- MPP-22220-10, Silicon Probes -- MPP-22220-W Tap40 metrology probe, 25 degree front angle, anisotropic geometry
Silicon Probes -- MPP-13100-10, Silicon Probes -- MPP-13100-W, Silicon Probes -- MPP-13120-10, Silicon Probes -- MPP-13120-W Tap525 metrology probe, 15 degree front angle, anisotropic geometry
Silicon Probes -- MPP-13200-10, Silicon Probes -- MPP-13200-W, Silicon Probes -- MPP-13220-10, Silicon Probes -- MPP-13220-W Tap525 metrology probe, 25 degree front angle, anisotropic geometry
Silicon Probes -- MPP-21100-10, Silicon Probes -- MPP-21100-W, Silicon Probes -- MPP-21120-10, Silicon Probes -- MPP-21120-W, Silicon Probes -- MPP-21123-10 Tap75 metrology probe, 15 degree front angle, anisotropic geometry
Silicon Probes -- MPP-21200-10, Silicon Probes -- MPP-21200-W, Silicon Probes -- MPP-21220-10, Silicon Probes -- MPP-21220-W Tap75 metrology probe, 25 degree front angle, anisotropic geometry
NSOM Probes -- 1641-00 Tuning fork, no fiber
Silicon Probes -- VL300, Silicon Probes -- VL300-A, Silicon Probes -- VL300-AW, Silicon Probes -- VL300-W, Silicon Probes -- VLCT, Silicon Probes -- VLCT-A, Silicon Probes -- VLCT-AW Value line metrology probe, 15 degree front angle, anisotropic geometry
Silicon Probes -- 1900-00, Silicon Probes -- 1910-00, Silicon Probes -- 1920-00, Silicon Probes -- 1930-00 dLever series probe, 12 degree front angle, isotropic geometry
For More Information
  • Send an E-mail
    to Veeco Instruments
  • View Supplier Profile
    for Veeco Instruments
  • Browse Catalog
    for Veeco Instruments
  • See Product Announcements
    from Veeco Instruments
  • Company Description:
    Veeco is a leading provider of Metrology and Process Equipment solutions used by manufacturers in the data storage, semiconductor, wireless, lighting and solar industries. These industries help create a wide range of information age technology and products, such as portable music players, cell... (more)
Next >>