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Display Options:None Hardness Testers Datasheets
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Other Hardness Testers
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CSM
from Agilent Technologies / Nanomechanical Instruments The CSM instrument extension offers a means of then separating the in-phase and out-of-phase components of the load-displacement history, providing an accurate measurement of the contact stiffness at all depths. Material properties are determined continuously as the indenter moves into the surface,...[See More]
Surface Property Analyzer -- Heidon 18L
from Kett US Scratch resistance is calculated as the result of continuous loading. A scratch needle is loaded onto the test surface. The mobile base holding the test piece travels with the applied load. When the scratch or film peeling begins, the vertical load can be calculated as the distance to the failure...[See More]
Scanning Probe Microscope Head -- diDimension Hybrid XYZ Head
from Veeco Instruments The Dimension™ Hybrid XYZ scanner for the Dimension V, Nanoman VS, and BioScope SZ SPM offers lower Z sensor noise and faster scanning than any other closed-loop system available. This patented hybrid head combines the benefits of the industry-leading Dimension tube scanner technology with a...[See More]
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