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Other Hardness Testers
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CSM
from Agilent Technologies / Nanomechanical Instruments The CSM instrument extension offers a means of then separating the in-phase and out-of-phase components of the load-displacement history, providing an accurate measurement of the contact stiffness at all depths. Material properties are determined continuously as the indenter moves into the surface,...[See More]
Similar parts from Agilent Technologies / Nanomechanical Instruments
DCM , G200 Nano Indenter , G300 Nano Indenter
Scanning Probe Microscope Head -- diDimension Hybrid XYZ Head
from Veeco Instruments The Dimension™ Hybrid XYZ scanner for the Dimension V, Nanoman VS, and BioScope SZ SPM offers lower Z sensor noise and faster scanning than any other closed-loop system available. This patented hybrid head combines the benefits of the industry-leading Dimension tube scanner technology with a...[See More]
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