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Semiconductor Products -- Proforma™ 300
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The Proforma 300 is completely menu-driven. The on-board intelligence provides fast, accurate, repeatable measurements for all types of wafer materials. Maximum measurement range or maximum probe/wafer stand-off distance can also be adjusted to meet your specific requirements.
- Menu-driven for Fast, Easy Setup.
- Proprietary Push-PullTM Probe Technology.
- High-resolution LCD Display.
- On-board Microprocessor for Accurate, Repeatable Measurements.
- Bubble Level.
- Adjustable Stage for Precise Leveling.
- Teflon Wafer Stage for Easy, Non-abrasive Positioning.
Specifications
| Technology / Type | Thickness Gage; Gaging System or Station; Wafer Thickness (Non-Contact), Flatness; Capacitance |
| Applications | Material Thickness |
| Form / Mounting | Bench, Rack or Floor Mounted; Handheld or Portable |
| Performance Specifications | |
| Range | 0.1016 to 1.0160 mm |
| Resolution | |
| Accuracy | |
| Other Specifications / Features | |
| Display Type | |
| Additional Features | |
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