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Test Module / Sub-system Automated Test Equipment Datasheets


Modular Scanner -- SC6540
from Associated Research, Inc.

The SC6540 modular scanner is designed to automate multi-point and multi-product testing when using OMNIA, HypotULTRA III, or HypotMAX models 7700 and 7704. There are 10 different configurations available that are built off of two basic scanning configurations determined by the power module. A...[See More]

  • Type / Form: Module, Sub-system or ATE Component; Input Stimulus or Signal Source Unit; Monitors Hypot Test Equipment 
  • Interface: IEEE-488 (GPIB) and RS-2332 interfaces 
  • Component / Product Tested: Monitors Hypot Equipment 
  • Features: Configurable Scanning Matrix 
View Datasheet
Digital IC Test -- Model 575A
from B&K Precision

The Model 575A is able to locate intermittent and temperature related faults by using its unconditional or conditional loop testing modes. Unknown device identification is easily accomplished by selecting SEARCH from the menu, selecting the number of pins on the device and activating Search Mode.[See More]

  • Type / Form: Module, Sub-system or ATE Component; Output Measurement or Monitoring Unit; Fixture / Interface 
  • Tester / Test Capability: In-Circuit Tester; Functional 
  • Component / Product Tested: Logic ICs; Memory; Passive Components; Semiconductors or Active Components 
  • Interface: Handheld Meter Visual Display 
View Datasheet
Advanced Line Emulator -- TS224A
from Black Box Network Services

Advanced Line Emulator...[See More]

  • Type / Form: Module, Sub-system or ATE Component 
  • Tester / Test Capability: Emulation 
  • Component / Product Tested: Networking or Communications Equipment 
  • Interface: Optical 
View Datasheet
IC Tester -- 570
from Fotronic Corporation / Test Equipment Depot

The Model 570A Analog and Model 575A Digital hand held IC Testers are compact, handheld, battery powered testers offer advanced functionality and ease of use. The 2-line x 16character dot matrix LCD shows the result of the test as a PASS or FAIL, together with individual pin diagnostics, test made,...[See More]

  • Type / Form: Module, Sub-system or ATE Component; Output Measurement or Monitoring Unit; Fixture / Interface; CAD Interface, Database, Test Program Generator or Other Test Software 
  • Tester / Test Capability: Manufacturing Defect Analyzer; Functional 
  • Component / Product Tested: Audio; MEMS or Electromechanical Devices; Passive Components; Power Supplies or Transformers; Optoelectronics; Networking or Communications Equipment; Semiconductors or Active Components; Linear / Mixed Signal (Analog) 
  • Interface: Handheld Meter Visual Display 
Similar parts from Fotronic Corporation / Test Equipment Depot
IC Tester -- 575 , Industrial Semiconductor Tester -- 520C , Transistor Tester -- 510A
View Datasheet
Partial Discharge Analysis System -- MPD600
from OMICRON electronics Corp. USA

Partial discharge (PD) phenomena is evidence of a degrading insulation capacity. As partial discharge often precedes an insulation breakdown of high voltage equipment, its detection and monitoring is of vital importance. The pioneers of multi-channel synchronous PD systems, mtronix, teamed up with...[See More]

  • Type / Form: Module, Sub-system or ATE Component; Output Measurement or Monitoring Unit; CAD Interface, Database, Test Program Generator or Other Test Software (optional feature) 
  • Tester / Test Capability: Partial Discharge Analysis 
  • Component / Product Tested: Power Supplies or Transformers; Generators 
View Datasheet
VT-RNS Series -- P Model L size (Post Paste)
from Omron Electronics LLC

VT-RNS In-line Inspection System is like having three inspection machines in one! Omron VT RNS model can be easily configured to perform three different types of printed circuit board inspections, making the VT RNS a very flexible machine that can be used to inspect PCBs at post paste, post...[See More]

  • Type / Form: Module, Sub-system or ATE Component; Optical Inspection 
  • Tester / Test Capability: X-ray 
  • Component / Product Tested: Loaded PCBs 
View Datasheet
V1000 Lifetest System
from TELOPS, Inc.

This vestal platform supports a variety of laser diodes, LEDs and SOAs. The V1000 is a true turnkey solution with everything you need for production burn-in or qualification/ongoing reliability and life testing.[See More]

  • Type / Form: Module, Sub-system or ATE Component; Output Measurement or Monitoring Unit 
  • Tester / Test Capability: Life or Endurance Test; Functional 
  • Component / Product Tested: Semiconductors or Active Components 
  • Features: Burn-In or Temperature Control; I-V; Temperature Control / Oven 
View Datasheet