Source Module / Unit Automated Test Equipment Datasheets

The SC6540 modular scanner is designed to automate multi-point and multi-product testing when using OMNIA, HypotULTRA III, or HypotMAX models 7700 and 7704. There are 10 different configurations available that are built off of two basic scanning configurations determined by the power module. A...[See More]

• Type / Form: Module, Sub-system or ATE Component; Input Stimulus or Signal Source Unit; Monitors Hypot Test Equipment 
• Interface: IEEE-488 (GPIB) and RS-2332 interfaces 

• Component / Product Tested: Monitors Hypot Equipment 
• Features: Configurable Scanning Matrix 

The equipment is semiconductor aging testing equipment to full-automatically execute burn-in processing and data measurement/judgment/analytical processing and also has tester function as well as temperature accelerating testing.[See More]

• Type / Form: Platform or Turnkey System; Output Measurement or Monitoring Unit; Input Stimulus or Signal Source Unit; Fixture / Interface 
• Tester / Test Capability: Life or Endurance Test; Functional 

• Component / Product Tested: MEMS or Electromechanical Devices; Passive Components; Loaded PCBs; Power Supplies or Transformers; Optoelectronics; Semiconductors or Active Components 
• Interface: Floating Probe 

Surface Insulation Resistance (SIR) testing is an industry-standard way of assessing the potential of board assemblies to fail through corrosion and other processes associated with ionic contamination. These failures can be induced by material interactions, inadequate process control, or poor...[See More]

• Type / Form: Platform or Turnkey System; Output Measurement or Monitoring Unit; Input Stimulus or Signal Source Unit 
• Tester / Test Capability: Functional 

• Component / Product Tested: BareBoard 
• Features: Resistance or Impedance; Temperature Control / Oven