Life / Endurance Testing Automated Test Equipment Datasheets

The equipment is semiconductor aging testing equipment to full-automatically execute burn-in processing and data measurement/judgment/analytical processing and also has tester function as well as temperature accelerating testing.[See More]

• Type / Form: Platform or Turnkey System; Output Measurement or Monitoring Unit; Input Stimulus or Signal Source Unit; Fixture / Interface 
• Tester / Test Capability: Life or Endurance Test; Functional 

• Component / Product Tested: MEMS or Electromechanical Devices; Passive Components; Loaded PCBs; Power Supplies or Transformers; Optoelectronics; Semiconductors or Active Components 
• Interface: Floating Probe 

Energy Recycling Air Cooled AC & DC Loads Intepro's electronic loads are ideal where high power bulk loading is required for burn-in and characterisation applications within Telecommunication and Aerospace sectors, Intepro’s environmental stress screening (ESS)/Burn-in solutions...[See More]

• Type / Form: Platform or Turnkey System; Load Bank or Electronic Load; CAD Interface, Database, Test Program Generator or Other Test Software 
• Tester / Test Capability: Life or Endurance Test 

• Component / Product Tested: Power Supplies or Transformers; Networking or Communications Equipment 
• Features: Burn-In or Temperature Control; I-V 

This vestal platform supports a variety of laser diodes, LEDs and SOAs. The V1000 is a true turnkey solution with everything you need for production burn-in or qualification/ongoing reliability and life testing.[See More]

• Type / Form: Module, Sub-system or ATE Component; Output Measurement or Monitoring Unit 
• Tester / Test Capability: Life or Endurance Test; Functional 

• Component / Product Tested: Semiconductors or Active Components 
• Features: Burn-In or Temperature Control; I-V; Temperature Control / Oven