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Temperature Controller Automated Test Equipment Datasheets


Semiconductor Aging Testing Equipment
from CHINO Works America Inc.

The equipment is semiconductor aging testing equipment to full-automatically execute burn-in processing and data measurement/judgment/analytical processing and also has tester function as well as temperature accelerating testing.[See More]

  • Type / Form: Platform or Turnkey System; Output Measurement or Monitoring Unit; Input Stimulus or Signal Source Unit; Fixture / Interface 
  • Tester / Test Capability: Life or Endurance Test; Functional 
  • Component / Product Tested: MEMS or Electromechanical Devices; Passive Components; Loaded PCBs; Power Supplies or Transformers; Optoelectronics; Semiconductors or Active Components 
  • Interface: Floating Probe 
View Datasheet
IC Tester -- 575
from Fotronic Corporation / Test Equipment Depot

The Model 575A is able to locate intermittent and temperature related faults by using its unconditional or conditional loop testing modes. Unknown device identification is easily accomplished by selecting SEARCH from the menu, selecting the number of pins on the device and activating Search Mode.[See More]

  • Type / Form: Module, Sub-system or ATE Component; Output Measurement or Monitoring Unit; Fixture / Interface 
  • Tester / Test Capability: Manufacturing Defect Analyzer; Functional 
  • Component / Product Tested: Logic ICs; Memory; Passive Components; Semiconductors or Active Components; System-On-Chip; RF & Microwave 
  • Interface: Handheld Meter Visual Display 
View Datasheet
V1000 Lifetest System
from TELOPS, Inc.

This vestal platform supports a variety of laser diodes, LEDs and SOAs. The V1000 is a true turnkey solution with everything you need for production burn-in or qualification/ongoing reliability and life testing.[See More]

  • Type / Form: Module, Sub-system or ATE Component; Output Measurement or Monitoring Unit 
  • Tester / Test Capability: Life or Endurance Test; Functional 
  • Component / Product Tested: Semiconductors or Active Components 
  • Features: Burn-In or Temperature Control; I-V; Temperature Control / Oven 
View Datasheet
Surface Insulation Resistance Test Sys -- PST-SIRTS-TURN-KEY
from Thermotron Industries

Surface Insulation Resistance (SIR) testing is an industry-standard way of assessing the potential of board assemblies to fail through corrosion and other processes associated with ionic contamination. These failures can be induced by material interactions, inadequate process control, or poor...[See More]

  • Type / Form: Platform or Turnkey System; Output Measurement or Monitoring Unit; Input Stimulus or Signal Source Unit 
  • Tester / Test Capability: Functional 
  • Component / Product Tested: BareBoard 
  • Features: Resistance or Impedance; Temperature Control / Oven 
View Datasheet