Logic ICs Automated Test Equipment Datasheets

The Model 575A is able to locate intermittent and temperature related faults by using its unconditional or conditional loop testing modes. Unknown device identification is easily accomplished by selecting SEARCH from the menu, selecting the number of pins on the device and activating Search Mode.[See More]

• Type / Form: Module, Sub-system or ATE Component; Output Measurement or Monitoring Unit; Fixture / Interface 
• Tester / Test Capability: In-Circuit Tester; Functional 

• Component / Product Tested: Logic ICs; Memory; Passive Components; Semiconductors or Active Components 
• Interface: Handheld Meter Visual Display 

The Model 575A is able to locate intermittent and temperature related faults by using its unconditional or conditional loop testing modes. Unknown device identification is easily accomplished by selecting SEARCH from the menu, selecting the number of pins on the device and activating Search Mode.[See More]

• Type / Form: Module, Sub-system or ATE Component; Output Measurement or Monitoring Unit; Fixture / Interface 
• Tester / Test Capability: Manufacturing Defect Analyzer; Functional 

• Component / Product Tested: Logic ICs; Memory; Passive Components; Semiconductors or Active Components; System-On-Chip; RF & Microwave 
• Interface: Handheld Meter Visual Display