View Larger

The CKT1175-MBA (for multiple-bus architecture) will provide seamless testing of electronic racks, panels and chassis containing passive and active components such as relays, solenoids, switches, circuit breakers, lamps and LED's, diodes, resistors, capacitors, etc. This functionality is made possible by a switching matrix that is up to 10 levels deep, plus a multiplexer that controls the various stimuli sources, instrumentation connections, and external energization outputs.

In addition to performing precise insulation resistance, dielectric breakdown and continuity testing, the CKT1175-MBA, with its expanded switching architecture, has the capability of routing multiple stimuli (or instruments) to any test point. In short, each test point is true random access and can be configured (under program control) as a standard switching point for 2-wire measurments, as a sense point for 4-wire resistance or data-bus phase measurements, as a stimuli energization point or a point that will connect ancilliary instrumentation (such as an LCR meter) to the assembly-under-test. Each test point can also be a "guarding" point for making accurate in-circuit component measurements, or for eliminating parasitic capacitances during capacitance measurements.