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Microfocus System X-ray Instruments and X-ray Systems Datasheets
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Other X-ray Instruments and X-ray Systems
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FISCHERSCOPE® -- X-RAY XDVM® -µ
from Fischer Technology, Inc. / Coating Thickness Gages The FISCHERSCOPE® X-RAY XDVM®-µ (SD) is used for the analysis of coating systems on microstructures. Due to its novel, patented mirror X-ray optics, this instrument can generate very small measurement spots of only about 20 µm x 50 µm in size with very high radiation intensities.[See More]
L10101
from Hamamatsu Corporation USA Microfocus X-ray Source (MFX) (xray mfx)...[See More]
Similar parts from Hamamatsu Corporation USA
L10321 
Coating Thickness Analyzer -- CMI900
from Oxford Instruments / Industrial Analysis CMI900 is a cost effective, high performanceXRF analyser for measurement of coating thickness and material composition.[See More]
X-Ray Inspection System -- X-Scope
from Scienscope International Corporation Scienscope International has over 14 years experience as a leading NDT (non-destructive testing) supplier of microscopes, industrial metrology systems, video measurement systems and high resolution cabinet X-Ray systems. The X-Scope 2000 is a general purpose, high resolution, fully programmable...[See More]
Pipe and Weld X-Ray Inspection Systems
from VJ Technologies, Inc. A major inspection challenge facing the boiler industries is to examine welds in tubing and plate during the manufacturing, erection, and start-up stages. In the steam generation business, billions are lost annually due to downtime caused by leaks in a plant's boiler tubes that is in commercial...[See More]
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