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XRD-6000
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The Windows XP-supported application software ushers this compact, multi-functional, general-purpose X-ray Diffractometer into the networking era of analysis. With its basic ease of use and abundant functions, the XRD-6000 offers solutions encompassing wide-ranging analysis requirements, from routine qualitative and quantitative analysis to state change analysis, including stress analysis, residual austenite quantitation, crystallite size/lattice strain, & crystallinity calculation
Specifications
| Operating Mode | Laboratory |
| Diffractometer Design | |
| Diffraction Method | Powder |
| Optics Design | Polycapillary Optical System |
| Sample Positioning & Rotation | |
| Positioning System | Goniometer |
| X-Ray Source & Optics | |
| X-ray Generator Output | |
| X-Ray Detector Design | |
| Type | |
| Diffracted Beam Optics | |
| Window Material | |
| Performance Specifications | |
| Angular Accuracy | |
| Scan Rate | |
| General Features | |
| Environment | |
| Operating Temperature | |
| Operating Humidity | |
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