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Welcome to GlobalSpec - a trusted source for engineers and industrial professionals.
Search GlobalSpec to find x ray powder diffraction-related products, suppliers, datasheets and CAD.
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X-ray diffraction instruments are used to measure crystal structure, grain size, texture and/or residual stress of materials and compounds through interaction of the X-ray beam with a sample. Search by Specification | Learn More
X-ray fluorescence spectrometers (XRFs) use a spectroscopic technique that is commonly used with solids, in which X-rays are used to excite a sample and generate secondary X-rays. Search by Specification | Learn More
X-ray instruments and X-ray systems use penetrating X-rays or gamma radiation to capture images of the internal structure of a part or finished product. Search by Specification | Learn More
X-ray tubes and X-ray sources are lamps that produce X-rays. Learn More
Spectrometers are analytical instruments which disperse an emission (such as particles or radiation) according to some property of the emission (such as mass or energy) in order to measure the amount of the dispersion. This product area includes Portable / Miniature, visible, infrared (IR), ultraviolet (UV), atomic absorption (AA), optical emission (OE), Raman, X-ray fluorescence (XRF) and mass spectrometers. Specific search forms are also available. Search by Specification | Learn More
Radiation shielding is used to block or attenuate the intensity of alpha particles (helium atoms), beta particles (electrons), X-ray radiation, and gamma radiation (energetic electromagnetic radiation). Learn More
...or brightness, thermal or infrared, multi-spectral, optical microscopes, x-ray, UV or fluorescence, confocal laser, electron microscope, ultrasonic or acoustic, and magnetic imaging. Search by Specification | Learn More
Powder testing equipment is used to measure the static and dynamic properties of powders for pharmaceutical, coating, and other solid-particulate applications. Search by Specification | Learn More
Imaging workstations are vision systems used for metrology or image analysis in laboratory and cleanroom settings. Search by Specification | Learn More
...and retrieve beams of high frequency acoustic energy. By contrast, infrared (IR) NDT material testers transmit or reflect radiation in order to determine absorption levels. X-ray diffraction and X-ray fluorescence are other non-destructive, radiographic test... Search by Specification | Learn More
...by capillary action. Non-destructive testing (NDT) services with radiographic or X-ray equipment use penetrating X-rays or gamma rays to capture images of the internal structure or a part or finished product. The density and composition... Search by Specification | Learn More
, magnetometers, optical systems, profilometers, reflectometers, resistance probes, RHEED systems, and X-ray diffractometers. Search by Specification | Learn More
...dimensional gages and instruments, eddy current instruments, hardness testers, materials testing equipment, magnetic particle equipment, microscopes and optical instruments, probes and styli, ultrasonic instruments, video imaging equipment, and X... Search by Specification | Learn More
...include radiography or X-ray analysis, laser holography or gaging, penetrant testing, and magnetic particle testing. Acoustic emission instruments and noise detectors are non-destructive testing (NDT) supplies and accessories for monitoring... Search by Specification | Learn More
...and radiographic or X-ray inspection. General NDT supplies and accessories include alloy identifiers, spot test kits, cables and adaptors, descalers and pickles, flaw markers, holders and clamps, illuminators and light meters, and magnifiers and mirrors... Search by Specification | Learn More
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VTM Rheometer Dynisco Plastics
SE-Series Environmental Test Chambers Thermotron Industries
Wire Rope, Chain & Cable - Tensile Strength AJT Equipment Limited
Vertical Plane Tensile Testing Machine AJT Equipment Limited
Extensometers, United Model EZ United Testing Systems, Inc.
Ocean oil rigs withstand major storms AJT Equipment Limited
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VJ Technologies, Inc. offers leading-edge solutions for the most advanced X-ray imaging applications. They offer custom X-ray Instruments and X-ray System solutions. (read more)
LHV Power (FKA Hitek Power) X-ray power supplies, designed to meet many inspection and analytical applications, power range capability from the top of the range 2kW Series XR2000 down to low power 50W Model XFR50 module.
These X-ray power supplies are used in industrial X-ray checking and inspection systems, X-ray diffraction (XRD) and X-ray fluorescence (XFR) analysis, as well as in (read more)
X-Ray fluorescence is a highly effective tool for materials analysis.
It is widely used for coating thickness measurement and is also well suited for element identification.
Powder and paste can be analyzed in the same manner as solid materials or liquids. Fast results are possible with our X-Ray Fluorescence Testing for WEEE and RoHS compliance. (read more)
For over 160 years ELCAN has been a leader in the advancement of imaging, from the very first 35 mm cameras to the very latest in digital radiography. ELCAN holds hundreds of unique patents, inventions and proprietary processes, all gained in the pursuit of optic and electronic innovation and customer success. (read more)
X-ray fluorescence (XRF) spectrometry is a powerful analytical technique for elemental analysis of a wide variety of materials in a highly precise and generally non-destructive way. XRF can be used for many elemental analysis applications, such as electronics, plastics, rubbers, geology, forensics, and WEEE / RoHS / ELV compliance testing. (read more)
Introducing a brand new design and model to improve your quality control without hurting your bottom line. Scienscope X-Scope inspection system is an affordable, yet extremely powerful solution. FDA Approved. (read more)
The PXS10-65W and PXS10-800 are MicroFocus X-Ray sources for applications requiring high power and high resolution. They operate from 45kV-130kV at up to 65W. They offer <6µm spot size and FOD of 14mm for excellent resolution and magnification. The completely integrated units combine a sealed tube, high voltage power supply and digital controller in a compact package. (read more)
The PXS10-16W is a MicroFocus X-Ray source for applications requiring the highest resolution. It operates from 45kV - 130kV at up to 16W. It offers focal spot size down to <5µm and a focus-to-object distance of 14mm for excellent resolution and magnification. The completely integrated unit combines a sealed tube, high voltage power supply and digital controller in a compact package. (read more)
The PXS5-925EA is a MicroFocus X-Ray source for high resolution radiographic applications and real time imaging. It operates from 45kV-90kV at up to 8W. It features a focal spot down to 7µm and a Focus-to-Object Distance (FOD) of 12mm for excellent resolution and magnification. The compact case houses an end-window sealed tube and high voltage power supply in a unit weighing only 8lbs. (read more)
The PXS5-724EA is an end-window MicroFocus X-Ray source for high resolution radiographic applications and real time imaging. It operates from 45kV - 70kV at up to 7W. The focal spot is <20µm at 7W and the Focus-to-Object Distance (FOD) is 12.5mm giving excellent resolution and magnification. The compact case houses a sealed tube and high voltage power supply in a unit weighing only 7lbs. (read more)
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Diffraction - Wikipedia, the free encyclopedia Diffraction occurs with all waves, including sound waves, water waves, and electromagnetic waves such as visible light, x-rays and radio waves. |
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The International Centre for Diffraction Data - ICDD - a... Advances in X-ray Analysis 2007 Public Report (PDF) Powder Diffraction Journal Grant-in-Aid Program ICDD Awards ICDD Product Tutorials PPXRD-8 See International Centre for Diffraction Data Information |
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1996 Building Publications - Guide for X-Ray Powder... Guide for X-Ray Powder Diffraction Analysis of Portland Cement and Clinker. |
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1996 Building Publications - Pattern Fitting for Quantitative... Pattern Fitting for Quantitative X-Ray Powder Diffraction Analysis of Portland Cement and Clinker. |
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X-Ray Powder Diffraction X-Ray Diffraction Experiment INTRODUCTION |
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Phase Analysis of Hydraulic Cements by X-Ray Powder... See ASTM International Information |
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ASTM E915 -96(2002) Standard Test Method for Verifying the... ASTM E915 - 96(2002) Standard Test Method for Verifying the Alignment of X-Ray Diffraction Instrumentation for Residual Stress Measurement See ASTM International Information |
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USGS: Science Topics: x-ray diffraction Laboratory manual for x-ray powder diffraction [New Window See U.S. Geological Survey Information |
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Bruker AXS: Home X-ray Microanalysis X-ray Diffraction X-ray Metrology Webinar - Structure Solutions from Powder X-ray Diffraction Oct 1, 2009 |
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HIGH TEMPERATURE SYNCHROTRON X-RAY POWDER DIFFRACTOMETER HIGH TEMPERATURE SYNCHROTRON X-RAY POWDER DIFFRACTOMETER X-ray wavelengths from 0.5 to 2.5 ? High temperature x-ray furnace |