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...including biological or life science, gemological, medical or forensic, metallurgical, measuring or inspection and semiconductor inspection. Electron microscopes are one of two main types: scanning electron microscopes (SEM) and transmission... Search by Specification | Learn More
...that transmit light or environmental scanning electron microscopes (SEM). Gemological microscopes use polarized light with lower magnifying powers to allow for brighter, sharper images combined with a wide field of view. Tool making specialty... Search by Specification | Learn More
...field, scanning electron microscope (SEM), scanning force or atomic probe microscope (SFM/AFM), stereoscopes and transmission electron microscopes. Acoustic and ultrasonic microscopes, compound microscopes, and fluorescent and UV microscopes... Search by Specification | Learn More
Web sensing systems and web scanning systems employ a variety of sensors that scan across a moving web to detect defects and measure parameters such as product basis weight, thickness and moisture. Learn More
Calorimeters and thermal analyzers contain a heat source that can deliver a heat flux, at a distinct temperature, into a sample, and a temperature-measuring device that can read the resultant change in temperature. Search by Specification | Learn More
Microscopy sample preparation equipment and metallography sample preparation equipment is used for the preparation of samples for metallographic or microscopic inspection and analysis. Learn More
Thermal management design and analysis services perform tests and redesigns around thermal dissipation issues. Search by Specification | Learn More
Thermal compounds and thermal interface materials form a thermally conductive layer on a substrate, between components or within a finished product. Search by Specification | Learn More
Thermal cutoffs and thermal protectors are nonresetting, thermally sensitive devices designed to protect domestic electrical appliances and industrial equipment from fire. They are sometimes described as thermal one-shot fuses. Search by Specification | Learn More
Thermal insulation and fireproofing materials reduce the flow of heat through the thickness of the material. They are typically fiber-based or foam structures prepared from thermally-stable materials. Search by Specification | Learn More
Thermal cyclers are laboratory instruments capable of generating and maintaining specific temperatures for a defined period of time. Search by Specification | Learn More
Thermostats and thermal switches are electro-mechanical on/off switches that are activated by temperature changes. They are typically used to control heating and cooling systems. Search by Specification | Learn More
Thermal oxidizers and catalytic oxidizers are used to destroy volatile organic compounds (VOC) in process gases. Search by Specification | Learn More
Overload relays prevent an electric motor from drawing too much current and overheating; includes thermal and solid state overload types. Search by Specification | Learn More
Scanning software is used with optical and document scanners or with other imaging equipment to digitize, create, edit and evaluate images. Learn More
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Phenom — the First "Point and Shoot" Desktop SEM FEI Company
Sub-micron imaging for metallurgical applications FEI Company
Electron Imaging Can Improve Your Science Courses FEI Company
Introducing the FEI Fibermetric System FEI Company
Desktop electron microscopy: empowering the user FEI Company
Phenom FEI Company
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PI's new P-541 nanopositioning piezo z-stage & piezo XY-stage family provides fast multiaxis motion to 200x200 (100 µm in Z), resolution to 0.1 nanometers in an extremely low profile package. Features: large aperture (beneficial in optical inspection and microscopy); parallel-kinematics flexure guiding system for friction free motion; nanometer precision trajectory control. (read more)
The PInano is a low profile, closed-loop piezo stage for super-resolution microscopy, such as single molecule microscopy. It comes in XY and XYZ configurations. An optional manual XY microscopy stage allows easy installation. (read more)
PicoCube™ XY and XYZ piezo stage scanning systems are ultra-high-performance, closed-loop piezoelectric scanning systems. Designed for AFM, SPM and nanomanipulation applications, they combine an extremely low-inertia (10 kHz resonant frequency!), high-speed piezo scanner with non-contact, direct-measuring, parallel-metrology capacitive feedback capable of 25 picometers resolution. (read more)
The M&P Lab is equipped with a sophisticated state-of-the-art scanning electron microscope (SEM) and an electron microprobe, which provide detailed information on a material's elemental composition, microscopic structure and surface topography. (read more)
Thermal chemistry analyses are used to determine melting points, coefficients of thermal expansion, glass transitions, solidus-liquidus and specific heat of various materials. (read more)
ITL provides analytical and characterization services using its three scanning electron microscopes that are also equipped with energy dispersive X-ray microanalysis systems. (read more)
The Scanning Electron Microscope (SEM) is one of the most versatile and widely used tools of modern science as it allows the study of both morphology and composition of biological and physical materials. (read more)
Versatile ♦ 10-1200 Channels ♦ Lab, Plant & Field ♦ Stand-Alone, PC or Web Connected (read more)
The P-612 precision Z-stage is a cost-effective, compact, piezo-based nano-positioning system with a travel range of 100 µm, for applications such as z-stack imaging. The space-saving design features a footprint of only 60 x 60 mm. The 20 x 20 mm clear aperture makes them ideally suited for sample positioning in microscopy. (read more)
Lumenera's INFINITY4-11 digital CCD camera is based on the Kodak KAI-11002 progressive scan CCD sensor. Matching the field of view of a 35mm camera with a 43.3mm diagonal, and boasting superior color reproduction, this camera is ideal for high-end scientific, industrial, medical, ophthalmic and life science applications. (read more)
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Scanning Thermal Microscopy - What does SThM stand for?... scanning speed scanning spot Scanning Spreading Resistance Microscopy Scanning SQUID Scanning Surface Inspection System scanning switch Scanning |
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physics@nature.com : Physics articles, jobs and information High-resolution scanning electron microscopy of an ultracold quantum gas Giant negative thermal expansion in magnetic nanocrystals See Nature Publishing Group Information |
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Scanning thermal microscopy of carbon nanotube electronic... Semiconductor Thermal Measurement and Management Symposium, 2005 IEEE Twenty First Annual IEEE Item Title: Scanning thermal microscopy of carbon |
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Theoretical study on thermal wave laminated imaging in... Theoretical study on thermal wave laminated imaging in scanning electron-acoustic microscopy |
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NTEGRA Therma ? Solutions for Mechanical and Thermal Drift in... NTEGRA Therma ? Solutions for Mechanical and Thermal Drift in Scanning and Atomic Force Microscopy by NT-MDT See AZoM Information |
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Characterization of the thermal properties by scanning thermal... Title: Characterization of the thermal properties by scanning thermal microscopy in ultrafine-grained iron surface layer produced by ultrasonic shot |
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Local thermal property analysis by scanning thermal microscopy... Title: Local thermal property analysis by scanning thermal microscopy of an ultrafine-grained copper surface layer produced by surface mechanical |
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ASTM International - Standards Worldwide Test Method for Linear Thermal Expansion of Solid Materials With a Push-Rod Dilatometer E0289-04 Test Method for Linear Thermal Expansion of Rigid See ASTM International Information |
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Magnesium Oxychloride-Based Foam Thermal Insulation: An... Magnesium Oxychloride-Based Foam Thermal Insulation: An Initial Investigation Rossiter, WJ Center for Building Technology, National Bureau of See ASTM International Information |
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Natalio Mingo - Publications and Presentations Lattice thermal conductivity crossovers in semiconductor nanowires Thermal conductivities of individual tin dioxide nanobelts, L. Shi., Q. Hao, Ch. |