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Products/Services for test probes for ict
Electric test probes are used to establish a connection between a circuit under test and the measuring instrument. Search by Specification | Learn More
Automated test equipment (ATE) is used to monitor and control test and measurement devices, keeping human interaction at a minimum. Search by Specification | Learn More
Hardness testers measure a material's resistance to indentation. This calculation is determined by measuring the permanent depth or projected area of the indentation. Search by Specification | Learn More
Coordinating measuring machine (CMM) probes are transducers that convert physical measurements into electrical signals, using various measuring systems within the probe structure. Search by Specification | Learn More
Environmental test chambers and rooms are used to ensure the reliability of industrial products, especially electronic items, through prolonged exposure to one or more environmental parameters. Search by Specification | Learn More
Environmental exposure (climatics) testing services use humidity, pressure, temperature, vibration, exposure to ultraviolet light (UV) and other climatic variables to test samples, parts and components, and finished products. Search by Specification | Learn More
IC pin probes are used to test integrated circuits (ICs). Search by Specification | Learn More
Hipot testers are electrical safety test devices that perform a variety of electrical compliance tests. Search by Specification | Learn More
Product and component testing services is the evaluation of a finished product or component through performance in electrical, life, environmental exposure, dynamic, ergonomic or other specialized tests. Also testing to standards such as UL 489, CE or MIL-STD 810. Search by Specification | Learn More
Non-destructive testing (NDT) material testers are devices, machines and equipment that are used to determine residual stress, alloy type, hardness, microstructure, elasticity, heat treatment and other material conditions without permanently altering or destroying the material being examined. Search by Specification | Learn More
Voltage testers check for difference in potential in electrical circuits. Search by Specification | Learn More
Chemical testing services test, analyze, and certify a wide range of chemicals for purity, chemical compatibility, and environmental impact. Search by Specification | Learn More
Current leakage testers measure the amount of current that leaks to ground. Search by Specification | Learn More
Leak testing equipment is used to measure the escape of liquids, vacuum or gases from sealed components or systems. Search by Specification | Learn More
Electrical safety testers are instruments used to test diverse electrical safety such as testing outlet polarity, line voltage level, ampere rating, medical equipment, and others. Search by Specification | Learn More
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Test Probes QA Technology Company, Inc.
Spring Contact Probes QA Technology Company, Inc.
X Probe Socketless Series QA Technology Company, Inc.
8R Steel Razor, Cutting Edge of Probe Technology QA Technology Company, Inc.
High Frequency (HF) Test & Measurement Accessories Multi-Contact USA
Test and Measurement Accessories Multi-Contact USA
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Product News for test probes for ict
Test Probes
QA's patented rolled design probes attribute their increased accuracy and performance to our fully automatic assembly and test machines. Our machines are designed and built in-house, from the micro-processor controllers to the assembly mechanisms themselves. (read more)
Custom Test Probes, Electrical
Multi-Contact USA manufactures custom electrical test and measurement accessories to match your specifications. (read more)
X Probe Socketless Series
The X Probe Socketless Series allows a more robust probe to be mounted on closer centers while maintaining a reliable electrical contact from the probe tip to the termination. The conventional method utilizes a probe and socket system. (read more)
Spring Contact Probes
QA's patented rolled design probes attribute their increased accuracy and performance to our fully automatic assembly and test machines. Our machines are designed and built in-house, from the micro-processor controllers to the assembly mechanisms themselves. (read more)
8R Steel Razor, Cutting Edge of Probe Technology
Faced with the challenges of making contact through today's problem processes such as OSP, Lead-Free solder paste and No-Clean process, QA Technology has created a new advanced tip style to solve these extreme conditions.
QA's new 8R Steel Razor cuts through fluxes without the added time and cost of repeated fixture actuations and false failures. (read more)
Long Stroke Teradyne Interfact Probes
QA Technology is pleased to offer a new long-stroke interface probe. This new probe can be used as replacements in Teradyne's TestStation LH and LX test systems. (read more)
13 to 20 GHz High Bandwidth Differential Probes
NEW! LeCroy WaveLink 13 to 20 GHz High Bandwidth Differential Solder-In Probes
20, 16, or 13 GHz bandwidth (read more)
Fluke 1520 Megohmmeter / Insulation Tester
The Fluke 1520 MegOhmMeter combines insulation resistance testing, AC/DC voltage measurement and Lo-Ohms function, in one rugged and convenient tool. The 1520 MegOhmMeter is used for testing insulation in power system wiring and motor windings in addition to offering a Lo-Ohms function for continuity and ground connection testing. The 1520 is easy to use with a simple interface. (read more)
Handheld Safety Tester for Biomed Equipment
The FIRST universal truly hand-held medical electrical safety analyzer which complies with the new IEC 62353 standard, to combine the features of an automatic / manual tester with a data logging / asset management facility. Our products offer the latest technologies such as incorporating BlueTooth and RFID capability. (read more)
Electrochemistry Meters/Interchangeable Probes
Hach announced three new fully interchangeable IntelliCAL probes for its HQd line of meters. These probes provide portable measurement of ORP, sodium, and pH for low-ionic strength samples for analysis in the lab or field. With the addition of these new probes, Hach now offers a full suite for electrochemistry testing. (read more)
Conduct Research
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Test Probes in Lead-Free Solder PCB Processes
New regulations will require the use of Pb-Free solder for many assemblies by July 1, 2006. This issue has prompted QA Technology to research the impact this will have on the selection of ICT probes....(read more)
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Agilent | United States Home -- please select -- Life Sciences & Chemical Analysis Electronic Test & Measurement About Agilent See Agilent Technologies, Inc. / Electronic Measurement Group Information |
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piercing of test vias at ICT piercing of test vias at ICT piercing of test vias at ICT piercing of test vias at ICT MA/NY DDave See SMTnet, Inc. Information |
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test probes false reject at ICT For the better part of my career, I've battled with ICT guys on so-called "flux residues" on their test probes, and this was when See SMTnet, Inc. Information |
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JTAG Boundary Scan Test Products, JTAG In-System Programming,... JTAG Test and Programming Software ScanExpress TPG Support for ICTs and Flying Probes ScanExpress Runner Gang See Corelis, Inc. Information |
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A bead probe CAD strategy for in-circuit test Test Conference Conference Title: International Test Conference 2007 Item Title: A bead probe CAD strategy for in-circuit test Publisher Name: IEEE |
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4.4 Incorporate Unified Structural and Functional Testing... 4.4 Incorporate Unified Structural and Functional Testing Improving Test Throughput with Emerging Technologies 233 Advances in IC & PCB technology ? See National Instruments Profile & Catalog |
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R Intel? Socket Test Technology for the LGA775 Socket Product... 9 3 Powered Testing With Digital Vectors (ICT) ..................................................................... 11 3.1 Using Voltage Identifier See Intel Corporation Information |
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Intel® Socket Test Technology Application Note Simplified Chinese version The Intel® Socket Test Technology for the LGA775 socket is a test chip that enables testing for the mechanical integrity See Intel Corporation Information |
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In-circuit test - Wikipedia, the free encyclopedia appropriate test pad size and location are all critical to increasing the probability that the spring-loaded probes in a bed-of-nails test fixture |
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Bead probe technology - Wikipedia, the free encyclopedia In-Circuit Testing (ICT). Node access is critical for components on the PCB to be electrically connected to the electronic test equipment that is |
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