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Welcome to GlobalSpec - a trusted source for engineers and industrial professionals.
Search GlobalSpec to find surface metrology-related products, suppliers, datasheets and CAD.
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Product Alerts
Keep current on the latest products, new suppliers, and technical articles of interest to you. (See Topics) |
Products/Services for surface metrology
Surface area and pore size analyzers are used to measure the surface area and pore size of a sample. Search by Specification | Learn More
Surface profilometers are contact or non-contact instruments used to measures surface profiles, roughness, waviness and other finish parameters. Search by Specification | Learn More
Surface metrology equipment is used to measure the surface finish and/or geometry of engineering components. Surface texture and topology characteristics include surface roughness, contour, form, waviness and defects. Search by Specification | Learn More
Dimensional measurement and metrology services use mechanical gaging, CMM measurement, non-contact imaging or other specialized methods to inspect and measure part dimensions and geometry. Search by Specification | Learn More
Semiconductor metrology instruments are designed for wafer and thin film in-line inspection after semiconductor processing. They include capacitance gages, C-V systems, electron beam probes, ellipsometers, interferometers, I-V system, magnetometers, optical systems, profilometers, reflectometers, resistance probes, RHEED systems, and X-ray diffractometers. Search by Specification | Learn More
Metrology fixtures and CMM fixtures are used to hold and position parts, probes, or workpieces during dimensional gaging and other measurement operations. Learn More
...of unequal distance. Fabrey-Perot interferometers are frequency-tuning devices that use the properties of interference between two adjacent, flat and parallel surfaces. Michelson interferometers have a half-silvered mirror at a 45° angle to the incoming... Search by Specification | Learn More
Overlays, veneers and surfacing materials are bonded to a surface to impart a decorative finish, graphic pattern and/or act as a protective film. Learn More
Condition monitoring and machine maintenance services monitor the condition of critical machines, battery banks, power supplies, processes and rotary equipment. They also perform predictive maintenance (PdM) and/or preventive maintenance. Search by Specification | Learn More
Instruments such as quartz crystal microbalance (QCM) monitors, ellipsometers, RHEED systems, imaging stations, CD-SEMs, ion mills, C-V systems specifically designed for wafer metrology or in-situ monitoring of thin film Search by Specification | Learn More
Finishing and surface treatment services pretreat or finish the surfaces of manufactured components to meet roughness or surface condition requirements. Search by Specification | Learn More
Surface finishing products and surface finishing equipment are used to refine or roughen a surface to meet surface finish requirements, or to clean, strengthen or prepare the surface for additional processing. Learn More
...such as roundness, angularity, squareness, straightness, flatness, runout, taper and concentricity. Form gages are similar to profilometers, inspection tools used to measure surface profile, roughness, waviness, and other finish parameters. There are two basic... Search by Specification | Learn More
Furniture consists of seating, benches, tables, cabinets and chairs for indoor or outdoor applications. Learn More
Surface grinding segments are bonded abrasive structures that can be assembled on a special form to create a large wheel for flat surface grinding. Search by Specification | Learn More
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Flowsorb III Micromeritics
ASAP 2020, Surface Area & Porosimetry System Micromeritics
ChemiSorb Series Chemisorption Analyzers Micromeritics
ASAP 2420 Surface Area and Porosimetry System Micromeritics
ASAP 2050 Xtended Pressure Sorption Analyzer Micromeritics
Diagnostic Tools for Electrical Plasma Hiden Analytical
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Product News for surface metrology
Surface Metrology Service Applications
The Surface Metrology Laboratory, located at Arnprior Rapid Manufacturing Solutions, houses the latest in 2D and 3D surface measurement and mapping instrumentation, customized profilometry software, and surface metrology expertise, (read more)
MarSurf™ WS 1 Optical Surface Metrology System
Mahr Federal has expanded its offerings in the world of optical surface metrology with the introduction of the MarSurf™ WS 1. Utilizing white light interferometry in a compact design, the MarSurf WS 1 offers vertical resolution of 0.1 nm (.004 µin) and provides three-dimensional measurement in only a few seconds. (read more)
Custom Surface Metrology Equipment
Raloid Tool Company, Inc. manufactures custom surface metrology equipment to match your specifications. (read more)
Metrology Services
Along with our turn-key systems, we also offer a full range of 3D measuring and inspection services. At SPG Data 3D we are committed in providing added value to your department and organization. Whether that is to deliver our expertise in engineering & metrology or simply to reduce your operational costs by means of our professional Accu3D metrology measurement services. (read more)
Metrology Services
Burloak's metrology team provides advanced measuring services. Our capabilities include large capacity dimensional inspection, reverse engineering, alignment services, rapid prototyping, part to CAD & CAD to part inspection, body in white inspection, digitization of patterns and tooling, jig & fixture certification as well as assembly, installation support and verification. (read more)
PerfectWave™ Metrology
ASML Optics offers, as standard products, extreme precision flats, spheres, aspheric lenses, and off-axis parabolic mirrors that can be used to fill the most demanding product and metrology requirements. Designed as a solution to satisfy commonly occurring needs and fabricated to tolerances that insure unquestioned performance, these components are available with reasonable cost... (read more)
Meeting your Metrology & Inspection Needs
Your operational environment demands precise, reliable, quality data—and quickly. To help, our specialized metrology engineers, using the best technological tools, can produce inspection reports to your exact requirements, at your premises or in our laboratories. In fact, they can take full charge of your inspection department so that you are better equipped to serve your clientele. (read more)
Cleanroom Metrology
Our cleanroom houses an array of custom designed system integrated metrology devices. Our cleanroom facility contains LVDT fulcrum beam measuring systems for high volume measuring of micron tolerances, twin sequential camera vision systems using parallel computer processors for defect identification and dual laser PLC full circumference parallelism and concentricity inspection. (read more)
Wafer Metrology Measurement Tool
The Proforma 300SA is a semi-automated tool for measuring wafer bow, warp, flatness and stress. (read more)
CNC Metrology at its best!
CNC Industries, Inc. believes their Metrology department is second to none. From the many highly experienced and qualified quality specialists that they have, to the best equipment available, they have the tools needed to manage and keep up with the huge volume of parts moving through the company on a daily basis. (read more)
Conduct Research
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Non-Contact 3D Surface Metrology of Large Grain High Purity Niobium by SLCM and FESEM (.pdf)
Abstract - Non-Contact 3D Surface Metrology of Large Grain High Purity Niobium by SLCM and FESEM Z.H. Sung, P.J. Lee and D.C, Larbalestier Applied Superconductivity Center, National High Magnetic...(read more)
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Precision Surface Metrology Enables Solar Efficiency Gains
The solar energy industry is experiencing rapid growth due to many factors, including record oil prices and the worldwide desire to reduce greenhouse gas emissions. World energy consumption is...(read more)
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Surfaces and their Measurements
Surfaces and their Measurements This book is primarily intended to help designers and inspectors to understand the fundamentals of surface metrology and, where appropriate, point to relevant...(read more)
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Scanning Probe/Atomic Force Microscopy: A Technology Overview (AN48)
Scanning probe microscopes (SPMs) are instruments that measure properties of surfaces. They include atomic force microscopes (AFMs) and scanning tunneling microscopes (STMs). In their first...(read more)
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Measuring the Right Things at the Right Time Will Add Value to Products and Processes
One of the jobs of metrology system manufacturers is to make better, more sophisticated products. Ironically, however, they are frequently met with the argument that because inspection is essentially...(read more)
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Characterizing CMP Pad Conditioner (AN540)
Faster computer processors require smaller features for integrated circuits (IC), which in turn require smoother substrate surfaces. Chemical mechanical polishing (CMP) has become one of the most...(read more)
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MEMS in Motion: a New Method for Dynamic MEMS Metrology (AN514)
Manufacturers of MicroElectroMechanical Systems (MEMS) rely on metrology to control their processes and to verify how their products will perform once they are packaged and in service. Since the...(read more)
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3D MEMS Metrology with Optical Profilers
Faster product development and reduced time-to-market have made optical surface profilers essential tools for three-dimensional metrology of MEMS. The Veeco Instruments Wyko® NT Series Optical...(read more)
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Large Field of View, High Spatial Resolution Surface Measurements
It is difficult in interferometric metrology to maintain high spatial resolution over a large field of view. Interferometric microscope measurements yield high resolution, but only over a small area....(read more)
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Improved Interferometric Optical Testing
Interferometry is used for testing optical components and optical systems as well as the metrology of many other components, such as the flatness and roughness of hard disk drive platters and the...(read more)
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Polytec TopMap Topography Measurement Systems | Scanning... Surface Metrology White-light Interferometers See Polytec, Inc. Profile & Catalog |
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Arnprior Rapid Manufacturing Solutions - Surface Metrology... Surface MetrologySurface Metrology Contact Stylus Profilometry Contact Stylus Profilometry See Arnprior Rapid Mfg Solutions Profile & Catalog |
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Unbenanntes Dokument |
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Precision Surface Metrology Enables Solar Efficiency Gains Precision Surface Metrology Enables Solar Efficiency Gains By: Erik Novak IntroductIon metrology for quality control. See Veeco Instruments Profile & Catalog |
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MATLAB Central - File detail - 3D Plot on a Spherical Surface 3D Plot on a Spherical Surface by J De Freitas SPHERE3D plots 3D data on a spherical surface. See MathWorks, Inc. (The) Information |
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CML: Research Research in tribology includes studies on head/disk metrology, interferometric microscopy, interfacial stiction and adhesion, environmental effects |
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B46 Project Team 47 Future Vision of Surface Metrology and B46... B46 Project Team 47 Future Vision of Surface Metrology and B46 Christopher A. Brown, Chair Surface Metrology Laboratory Worcester Polytechnic |
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ASME B46 June 8, 2006 Detroit On establishing differentiation... On establishing differentiation and correlation capabilities for surface metrology systems ? new software and a view towards standardization |
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Netscape | Company Boardroom SANTA BARBARA, CA, January 15, 1999?Veeco Metrology Group, the world leader in 3D surface metrology, announces the 30th anniversary of the |
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Netscape | Company Boardroom exchange: NASDAQ Global Market (.O)) News Release - 15-Jan-1999 Veeco Metrology Group Announces Faster, More Powerful Line of R&D Surface Profilers |
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