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Products/Services for Rutherford backscattering spectrometry
Instruments such as quartz crystal microbalance (QCM) monitors, ellipsometers, RHEED systems, imaging stations, CD-SEMs, ion mills, C-V systems specifically designed for wafer metrology or in-situ monitoring of thin film parameters during thin film or semiconductors wafer processing. Search by Specification | Learn More about Wafer and Thin Film Instrumentation
Semiconductor metrology instruments are designed for wafer and thin film in-line inspection after semiconductor processing. They include capacitance gages, C-V systems, electron beam probes, ellipsometers, interferometers, I-V system, magnetometers, optical systems, profilometers, reflectometers, resistance probes, RHEED systems, and X-ray diffractometers. Search by Specification | Learn More about Semiconductor Metrology Instruments
...elements in a compound. Mass spectrometers are used in both quantitative and qualitative analysis, including high-resolution accurate mass measurements for the determination of elemental compositions. Mass spectrometry (MS) is an analytical spectroscopic... Search by Specification | Learn More about Mass Spectrometers
Spectrometers are analytical instruments which disperse an emission (such as particles or radiation) according to some property of the emission (such as mass or energy) in order to measure the amount of the dispersion. This product area includes Portable / Miniature, visible, infrared (IR), ultraviolet (UV), atomic absorption (AA), optical emission (OE), Raman, X-ray fluorescence (XRF) and mass spectrometers. Specific search forms are also available. Search by Specification | Learn More about Spectrometers
...of specialty spectrometers are available. Secondary ion mass spectrometry (SIMS) is a technique for analyzing the surface of a thin film test sample. An ion mass spectrometer is used to analyze the particles emitted by an object after... Learn More about Specialty Spectrometers and Accessories
...as laboratory standards, as well as for detection, sample preparation, environmental monitoring, and analysis applications. Analytical or laboratory applications may include gas chromatography (GC, GC-MS, LC-MS), spectrometry (ICP, ICP-MS, Flame... Learn More about Laboratory and Calibration Gases
UV and visible spectrometers measure the amount of ultraviolet (UV) and visible light transmitted or absorbed by a sample placed in the spectrometer. Search by Specification | Learn More about UV and Visible Spectrometers
...hermeticity testing, laser ablation ICP (LA-ICP), and mass spectrometry (MS) are also available. Analytical laboratory services test samples to a variety of certification and approval standards. They also adhere to many different facility... Search by Specification | Learn More about Analytical Laboratory Services
Atomic emission and optical emission spectrometers determine analyte concentration via a quantitative measurement of the optical emission from excited atoms. Search by Specification | Learn More about Atomic Emission and Optical Emission Spectrometers
X-ray diffraction instruments are used to measure crystal structure, grain size, texture and/or residual stress of materials and compounds through interaction of the X-ray beam with a sample. Search by Specification | Learn More about X-ray Diffraction Instruments
X-ray fluorescence spectrometers (XRFs) use a spectroscopic technique that is commonly used with solids, in which X-rays are used to excite a sample and generate secondary X-rays. Search by Specification | Learn More about X-ray Fluorescence Spectrometers
Test, inspection and measurement software is used to design, automate and implement the testing of instruments and equipment, and the measurement of device parameters. Search by Specification | Learn More about Test, Inspection and Measurement Software
...atoms for mass spectrometry. Combustion is an exothermic chemical reaction due to rapid oxidation. Diffraction evaluates crystal structure, grain size, texture and/or residual stress. Environmental testing subjects media to conditions... Search by Specification | Learn More about Material Testing Services
...emission spectroscopy and ionizes atoms for mass spectrometry. Infrared (IR) spectroscopy measures the wavelength and absorption intensity of infrared light. Microscopy uses instruments such as optical and electron microscopes to study the structure... Search by Specification | Learn More about Chemical Testing Services
Fiber optic probes collect light or spectra from extreme environments inside reaction vessels at high temperatures or pressures. Product types include UV-Vis spectroscopy probes, Raman spectroscopy probes, and refractometry probes. Search by Specification | Learn More about Fiber Optic Probes
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Thin Film Measurement System StellarNet, Inc.
Wafer Measurement System from MTI Instruments MTI Instruments Inc.
Wafer Inspection Systems Olympus America Inc.
Wafer Measurement System MTI Instruments Inc.
CC-10 Wide Range Vacuum Gauge Televac
New Digital AVC Vacuum Gage Teledyne Instruments
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Product News for Rutherford backscattering spectrometry
Chemical Analysis Services Mass Spectrometry
Glow-Discharge Mass Spectrometry (GDMS):
Most suited for determining the metallic impurities (read more)
X-ray fluorescence (XRF) spectrometry Services
X-ray fluorescence (XRF) spectrometry is a powerful analytical technique for elemental analysis of a wide variety of materials in a highly precise and generally non-destructive way. XRF can be used for many elemental analysis applications, such as electronics, plastics, rubbers, geology, forensics, and WEEE / RoHS / ELV compliance testing. (read more)
SV16BI Rotary Vane Vacuum Pump
Export, PA - March 2009 - Oerlikon Leybold Vacuum introduces the SOGEVAC® SV16 BI, a compact single-stage rotary vane vacuum pump for Analytical Applications including Mass Spectrometry. SOGEVAC SV16 BI offers a low-maintenance alternative over traditional two-stage rotary vane vacuum pumps. (read more)
The Proven Test Method for Many Applications
Beta Backscatter method offers a great deal of versatility and can be used to measure: paint, oil, lubricating films, plastic, enamel, ceramic and phosphate coatings on metals and some non-metals. Also metal coatings on other metals, including some coatings too thick for X-ray test methods. (read more)
PICO® Helium Leak Detectors
Incorporating advanced technology in the area of mass spectrometry and vacuum technology (patents pending), the PICO® Mass-Spectrometer-based Leak Detectors provide fast, contamination-free, helium leak detection. (read more)
Electron Microscopy
The M&P Lab is equipped with a sophisticated state-of-the-art scanning electron microscope (SEM) and an electron microprobe, which provide detailed information on a material's elemental composition, microscopic structure and surface topography. (read more)
The Varian 300-MS quadrupole GC/MS
The Varian 300-MS provides cost-conscious laboratories with a flexible easy to use instrument designed to boost your productivity.
It offers a choice of configurations to match your budget and your needs:
- High throughput
- Reliable quantification
- Excellent sensitivity
500uJ, 355nm UV laser for MALDI TOF
RPMC Lasers offers the PEAK. The perfect replacement for that N2 laser being used in your MALDI TOF mass spectrometry systems. (read more)
Varian 900-MS Series FTMS
Varian 900-MS Series FTMS instruments allow for quick and easy analysis to provide detailed information about molecules from proteins to petrochemicals. Extremely accurate mass determination (< 1 ppm) and ultra-high resolution (> 500,000) maximizes the amount of information you can acquire and greatly simplifies data interpretation. (read more)
TGA-MS with the Hiden HPR-20
Coupling a Mass Spectrometer to Thermal Analysis techniques provides for evolved gas analysis as a function of time and temperature. The combined TA-MS data is used to characterize materials. (read more)
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Ion beam induced mixing of co-sputtered Au?Ni films analyzed... Ion beam induced mixing of co-sputtered Au?Ni films analyzed by Rutherford backscattering spectrometry |
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Superconducting magnet for a cyclotron Rutherford... Superconducting magnet for a cyclotron Rutherford backscattering spectrometry system |
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Radiation-Induced Segregation in Cu-Au Alloys Radiation-induced segregation in a Cu-lat.% Au alloy was investigated using in-situ Rutherford backscattering spectrometry. See ASTM International Information |
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Phase Dissolution Caused by Reimplantation Studied by... See ASTM International Information |
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Growth analysis of self-formed Ti-rich interface layers in... Growth analysis of self-formed Ti-rich interface layers in Cu(Ti)/dielectric-layer samples using Rutherford Backscattering Spectrometry |
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PZT thin films by laser ablation as well as in an oxygen ambient, and the compositions were analyzed by Rutherford backscattering spectrometry and energy dispersive spectroscopy. |
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Surface and oxide narrow-gap semiconductor interface... The procedure of Rutherford backscattering spectrometry (RBS) is worked out for following goals: firstly, investigation of stoichiometry damages of |
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Quantitative secondary ion mass spectrometry (SIMS) of III-V... Rutherford backscattering spectrometry (RBS) and x-ray diffraction (XRD) data were cross-correlated with the MCs+ results. |
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science24.com - Characterization of Al-Ni / a-Si interface by... Characterization of Al-Ni / a-Si interface by high resolution Rutherford backscattering spectrometry |
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Poster Session 5 |
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