X-ray diffraction instruments are used to measure crystal structure, grain size, texture and/or residual stress of materials and compounds through interaction of the X-ray beam with a sample. Search by Specification | Learn More about X-ray Diffraction Instruments

X-ray fluorescence spectrometers (XRFs) use a spectroscopic technique that is commonly used with solids, in which X-rays are used to excite a sample and generate secondary X-rays. Search by Specification | Learn More about X-ray Fluorescence Spectrometers

X-ray tubes and X-ray sources are lamps that produce X-rays. Learn More about X-ray Tubes and Sources

Spectrometers are analytical instruments which disperse an emission (such as particles or radiation) according to some property of the emission (such as mass or energy) in order to measure the amount of the dispersion. This product area includes Portable / Miniature, visible, infrared (IR), ultraviolet (UV), atomic absorption (AA), optical emission (OE), Raman, X-ray fluorescence (XRF) and mass spectrometers. Specific search forms are also available. Search by Specification | Learn More about Spectrometers

Radiation shielding is used to block or attenuate the intensity of alpha particles (helium atoms), beta particles (electrons), X-ray radiation, and gamma radiation (energetic electromagnetic radiation). Learn More about Radiation Shielding

...and sleeve bushings are also available. Selecting linear slides and linear stages requires an analysis of axis configuration and travel specifications. Single-axis systems have only one carriage or saddle and move along the X-axis. By contrast... Search by Specification | Learn More about Linear Slides and Linear Stages

...or brightness, thermal or infrared, multi-spectral, optical microscopes, x-ray, UV or fluorescence, confocal laser, electron microscope, ultrasonic or acoustic, and magnetic imaging. Search by Specification | Learn More about Machine Vision Systems

...to consider when searching for PCI products include the technology type, form factor, PCI data bus, and number of ports. Technology choices include the standard PCI bus and PCI-X. PCI-X is a standard based on the PCI bus that enables 64-bit, 133-MHz... Search by Specification | Learn More about PCI Products

...manufacturers’ chucks. Several standard mounting configurations exist for chuck jaws including fine serrated (1.5mm x 60° and 1/16" x 90°), serrated (3.0mm x 60° and 3/32" x 90°), ACME key, American standard tongue &... Search by Specification | Learn More about Chuck Jaws

Imaging workstations are vision systems used for metrology or image analysis in laboratory and cleanroom settings. Search by Specification | Learn More about Imaging Workstations

...and retrieve beams of high frequency acoustic energy. By contrast, infrared (IR) NDT material testers transmit or reflect radiation in order to determine absorption levels. X-ray diffraction and X-ray fluorescence are other non-destructive, radiographic test... Search by Specification | Learn More about Nondestructive Testing (NDT) Material Testers

...electromagnetic, magnetic (induction or Barkhausen), magnetic particle system, optical (shearography, holography, or magneto optical, penetrant testing, and radiographic or X-Depending on the method and measurement requirements, non-destructive testing... Search by Specification | Learn More about Nondestructive Testing (NDT) Services

...signals the framegrabber can handle simultaneously. High-resolution cameras support camera inputs greater than 1000 x 1000 pixels. Output choices for frame grabbers include RS170, CCIR, RS330, RS422, NTSC, Y/C, RGB, PAL, SVGA, and VGA. Common... Search by Specification | Learn More about Frame Grabbers

, magnetometers, optical systems, profilometers, reflectometers, resistance probes, RHEED systems, and X-ray diffractometers. Search by Specification | Learn More about Semiconductor Metrology Instruments