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Products/Services for ray diffractometer x
X-ray diffraction instruments are used to measure crystal structure, grain size, texture and/or residual stress of materials and compounds through interaction of the X-ray beam with a sample. Search by Specification | Learn More
Instruments such as quartz crystal microbalance (QCM) monitors, ellipsometers, RHEED systems, imaging stations, CD-SEMs, ion mills, C-V systems specifically designed for wafer metrology or in-situ monitoring of thin film parameters during thin film or semiconductors wafer processing. Search by Specification | Learn More
, magnetometers, optical systems, profilometers, reflectometers, resistance probes, RHEED systems, and X-ray diffractometers. Search by Specification | Learn More
X-ray instruments and X-ray systems use penetrating X-rays or gamma radiation to capture images of the internal structure of a part or finished product. Search by Specification | Learn More
X-ray fluorescence spectrometers (XRFs) use a spectroscopic technique that is commonly used with solids, in which X-rays are used to excite a sample and generate secondary X-rays. Search by Specification | Learn More
X-ray tubes and X-ray sources are lamps that produce X-rays. Learn More
Portable / Miniature, visible, infrared (IR), ultraviolet (UV), atomic absorption (AA), optical emission (OE), Raman, X-ray fluorescence (XRF Search by Specification | Learn More
Radiation shielding is used to block or attenuate the intensity of alpha particles (helium atoms), beta particles (electrons), X-ray radiation, and gamma radiation (energetic electromagnetic radiation). Learn More
...or brightness, thermal or infrared, multi-spectral, optical microscopes, x-ray, UV or fluorescence, confocal laser, electron microscope, ultrasonic or acoustic, and magnetic imaging. Search by Specification | Learn More
...dimensional gages and instruments, eddy current instruments, hardness testers, materials testing equipment, magnetic particle equipment, microscopes and optical instruments, probes and styli, ultrasonic instruments, video imaging equipment, and X... Search by Specification | Learn More
Imaging workstations are vision systems used for metrology or image analysis in laboratory and cleanroom settings. Search by Specification | Learn More
...and retrieve beams of high frequency acoustic energy. By contrast, infrared (IR) NDT material testers transmit or reflect radiation in order to determine absorption levels. X-ray diffraction and X-ray fluorescence are other non-destructive, radiographic test... Search by Specification | Learn More
...by capillary action. Non-destructive testing (NDT) services with radiographic or X-ray equipment use penetrating X-rays or gamma rays to capture images of the internal structure or a part or finished product. The density and composition... Search by Specification | Learn More
...and recalibrate any of the particular ink-supplying units on the press to compensate for errors. A transmission density meter measures the densities of transparent films for photographic, X-ray, and microfilm applications. Special types... Learn More
...of products: cathode ray tube (CRT) monitors and flat panel displays (FPD). CRTs are sealed, glass tubes that generate light from an electron beam. The beam is produced by the acceleration of electrons from a heated cathode and grid towards the front... Search by Specification | Learn More
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SE-Series Environmental Test Chambers Thermotron Industries
VTM Rheometer Dynisco Plastics
BioCold Environmental: Cold Rooms BioCold Environmental, Inc.
Critical Storage BioCold Environmental, Inc.
Cold Rooms BioCold Environmental, Inc.
Environmental Chambers United Testing Systems, Inc.
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Product News for ray diffractometer x
Custom X-ray Instruments and X-ray Systems
VJ Technologies, Inc. offers leading-edge solutions for the most advanced X-ray imaging applications. They offer custom X-ray Instruments and X-ray System solutions. (read more)
Custom X-ray Instruments and X-ray Systems
For over 160 years ELCAN has been a leader in the advancement of imaging, from the very first 35 mm cameras to the very latest in digital radiography. ELCAN holds hundreds of unique patents, inventions and proprietary processes, all gained in the pursuit of optic and electronic innovation and customer success. (read more)
X-Scope Real-Time X-Ray System NDT
Introducing a brand new design and model to improve your quality control without hurting your bottom line. Scienscope X-Scope inspection system is an affordable, yet extremely powerful solution. FDA Approved. (read more)
PXS10-65W/PXS10-800 130 kV MicroFocus X-ray Source
The PXS10-65W and PXS10-800 are MicroFocus X-Ray sources for applications requiring high power and high resolution. They operate from 45kV-130kV at up to 65W. They offer <6µm spot size and FOD of 14mm for excellent resolution and magnification. The completely integrated units combine a sealed tube, high voltage power supply and digital controller in a compact package. (read more)
PXS10-16W 130 kV MicroFocus X-ray Source
The PXS10-16W is a MicroFocus X-Ray source for applications requiring the highest resolution. It operates from 45kV - 130kV at up to 16W. It offers focal spot size down to <5µm and a focus-to-object distance of 14mm for excellent resolution and magnification. The completely integrated unit combines a sealed tube, high voltage power supply and digital controller in a compact package. (read more)
PXS5-925EA, 90 kV MicroFocus X-Ray Source
The PXS5-925EA is a MicroFocus X-Ray source for high resolution radiographic applications and real time imaging. It operates from 45kV-90kV at up to 8W. It features a focal spot down to 7µm and a Focus-to-Object Distance (FOD) of 12mm for excellent resolution and magnification. The compact case houses an end-window sealed tube and high voltage power supply in a unit weighing only 8lbs. (read more)
PXS5-724EA, 70 kV MicroFocus X-Ray Source
The PXS5-724EA is an end-window MicroFocus X-Ray source for high resolution radiographic applications and real time imaging. It operates from 45kV - 70kV at up to 7W. The focal spot is <20µm at 7W and the Focus-to-Object Distance (FOD) is 12.5mm giving excellent resolution and magnification. The compact case houses a sealed tube and high voltage power supply in a unit weighing only 7lbs. (read more)
PXS5-927, 90 kV MicroFocus X-Ray Source
The PXS5-927 is a MicroFocus X-Ray source for applications requiring the highest resolution. It operates from 20kV - 90kV at up to 8W. It features a round focal spot with size down to 4µm and a working distance of 8.5mm for outstanding resolution and magnification. The completely integrated unit combines a sealed tube, high voltage power supply and digital controller in a compact package. (read more)
PXS5-822SA, 80 kV MicroFocus X-Ray Source
The PXS5-822SA is a side-window MicroFocus X-Ray source for high resolution radiographic applications and real time imaging. It operates from 45kV - 80kV at up to 8W. The focal spot is <20µm at 8W and the Focus-to-Object Distance (FOD) is 12.5mm giving excellent resolution and magnification. The compact case houses a sealed tube and high voltage power supply in a unit weighing only 7lbs. (read more)
PXS11-150-75, 75 kV Mini-Focus X-Ray Source
The PXS11-150-75 is a Mini-Focus X-Ray source for high resolution radiographic and real time imaging applications. It operates from 40kV - 75kV at up to 11.25W. It features a focal spot size of 45µm at 11.25W and a working distance of 8.9mm for high resolution and magnification. The unit combines a sealed tube, high voltage power supply and control circuitry in a robust and compact package. (read more)
Conduct Research
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A Method of Determining the Elastic Properties of Alloys in Selected Crystallographic Directions For X-Ray Diffraction Residual Stress Measurement (.pdf)
A technique and apparatus are described for obtaining the elastic constant E/(1 + ?) in selected crystallographic directions for the purpose of calibrating x-ray diffraction residual stress...(read more)
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HIGH TEMPERATURE SYNCHROTRON X-RAY DIFFRACTOMETER HIGH TEMPERATURE SYNCHROTRON X-RAY DIFFRACTOMETER X-ray wavelengths from 0.5 to 2.5 Å High temperature x-ray furnace |
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Newport Corporation | Custom Motion Systems | X-Ray... See Newport Corporation Information |
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Residual stress, retained austenite, grinding burn and heat... XSTRESS 3000 X-ray stress analyzer, X-ray diffractometer XSTRESS 3000 X-ray stress analyzer, X-ray diffractometer See American Stress Technologies, Inc. Information |
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X-Ray Powder Diffraction X-RAY ANALYSIS OF A SOLID Experiment Developed with National Science Foundation Funding. X-Ray Diffraction Experiment INTRODUCTION |
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High Temperature X-Ray Diffractometer for Advanced Materials... Abstract: The X-ray diffractometer system purchased under the grant consists of an X-ray generator and associated equipment for determination of See Storming Media LLC Information |
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Multiple-position x-ray tube for diffractometer invention Multiple-position x-ray tube for diffractometer -> Monitor Keywords Multiple-position x-ray tube for diffractometer |
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Scanning line detector for two-dimensional x-ray... Scanning line detector for two-dimensional x-ray diffractometer -> Monitor Keywords Scanning line detector for two-dimensional x-ray diffractometer |
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X-Ray Diffraction Some Background about X-Ray Diffraction There exists systematic X-ray diffraction data for thousands of mineral species. |
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8 Portable Parallel Beam X-Ray Diffraction System for In-Line Process Control in the Steel Industry--X-Ray Optical Systems, Inc., 30 Corporate Circle, |
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ASTM D934 -08 Standard Practices for Identification of... ASTM D934 - 08 Standard Practices for Identification of Crystalline Compounds in Water-Formed Deposits By X-Ray Diffraction See ASTM International Information |
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