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Products/Services for ray diffraction
X-ray diffraction instruments are used to measure crystal structure, grain size, texture and/or residual stress of materials and compounds through interaction of the X-ray beam with a sample. Search by Specification | Learn More
X-ray fluorescence spectrometers (XRFs) use a spectroscopic technique that is commonly used with solids, in which X-rays are used to excite a sample and generate secondary X-rays. Search by Specification | Learn More
X-ray instruments and X-ray systems use penetrating X-rays or gamma radiation to capture images of the internal structure of a part or finished product. Search by Specification | Learn More
...and retrieve beams of high frequency acoustic energy. By contrast, infrared (IR) NDT material testers transmit or reflect radiation in order to determine absorption levels. X-ray diffraction and X-ray fluorescence are other non-destructive, radiographic test... Search by Specification | Learn More
A diffraction grating uses a substrate with parallel grooves to disperse light into its spectra. Eschelles are included in this area. Search by Specification | Learn More
X-ray tubes and X-ray sources are lamps that produce X-rays. Learn More
...or brightness, thermal or infrared, multi-spectral, optical microscopes, x-ray, UV or fluorescence, confocal laser, electron microscope, ultrasonic or acoustic, and magnetic imaging. Search by Specification | Learn More
X-ray diffraction, and measurement applications. Specialized focal plane arrays include avalanche focal plane arrays, adaptive focal plane arrays, high-speed focal plane arrays, and industrial focal plane arrays. Avalanche diameters are small... Search by Specification | Learn More
...equipment, die-casting and machine tooling, chemical processing, pharmaceutical formulation, food and beverage processing, lasers, vacuum systems, X-ray diffraction, power supplies and power generation stations, analytical equipment, semiconductors... Search by Specification | Learn More
...or industrial robots, robotic systems, or for satellite testing. Applications for multi-axis positioning systems include micromachining, micromanipulation, X-ray diffraction measurement, semiconductor processing, and machine tool control. Products... Learn More
Imaging workstations are vision systems used for metrology or image analysis in laboratory and cleanroom settings. Search by Specification | Learn More
Portable / Miniature, visible, infrared (IR), ultraviolet (UV), atomic absorption (AA), optical emission (OE), Raman, X-ray fluorescence (XRF Search by Specification | Learn More
Radiation shielding is used to block or attenuate the intensity of alpha particles (helium atoms), beta particles (electrons), X-ray radiation, and gamma radiation (energetic electromagnetic radiation). Learn More
, magnetometers, optical systems, profilometers, reflectometers, resistance probes, RHEED systems, and X-ray diffractometers. Search by Specification | Learn More
...ray fluorescence analysis. A laser preparation sample may be a powdered specimen sample or a biological specimen treated with specific nucleic acids or proteins. Laboratories that use specialty sample preparation equipment have a variety... Learn More
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VTM Rheometer Dynisco Plastics
SE-Series Environmental Test Chambers Thermotron Industries
Super-Long-Beam Flex Tester United Testing Systems, Inc.
Extensometers, United Model EZ United Testing Systems, Inc.
Wire Rope, Chain & Cable - Tensile Strength AJT Equipment Limited
Economy SSTM Series United Testing Systems, Inc.
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Product News for ray diffraction
XRK 900 Reactor Chamber from Anton Paar
XRK 900 is the only heating chamber for X-ray diffraction experiments on the market specifically designed for studies of solid state and solid state-gas reactions up to 900 °C and 10 bar. It is a unique tool for in-situ XRD investigations - unmatched in robustness and performance. (read more)
Residual Stress Analysis
Residual stresses are vital to the overall strength and life of critical components. Most processes involved in the manufacture of a component can cause residual stresses that will be either detrimental or beneficial to its strength and longevity. (read more)
X-Ray Power Supplies
LHV Power (FKA Hitek Power) X-ray power supplies, designed to meet many inspection and analytical applications, power range capability from the top of the range 2kW Series XR2000 down to low power 50W Model XFR50 module.
These X-ray power supplies are used in industrial X-ray checking and inspection systems, X-ray diffraction (XRD) and X-ray fluorescence (XFR) analysis, as well as in (read more)
The Fastest Dual Wavelength Diffraction System
Introducing the SuperNova™ The Fastest, Most Intense Dual Wavelength Diffraction System
The SuperNova is the first dual wavelength diffraction system to use entirely high intensity micro-source X-ray technology. (read more)
Retained Austenite Measurement
Hardening of steels requires heating to an austenitic phase and quenching to room temperature to produce a hard martensitic phase. Due to incomplete transformation some austenite is retained at room temperature. Retained austenite can have a detrimental affect on the mechanical properties of the steel... (read more)
Finite Element Analysis (FEA)
Lambda Technologies provides finite element analysis (FEA) services in support of residual stress design and characterization. (read more)
Silver Metal Filters
Pure silver metal membrane filter for microfiltration. Excellent chemical and thermal compatibility with specific pore size rating from 0.2 to 5.0 micron. (read more)
Custom X-ray Instruments and X-ray Systems
VJ Technologies, Inc. offers leading-edge solutions for the most advanced X-ray imaging applications. They offer custom X-ray Instruments and X-ray System solutions. (read more)
Custom X-ray Instruments and X-ray Systems
For over 160 years ELCAN has been a leader in the advancement of imaging, from the very first 35 mm cameras to the very latest in digital radiography. ELCAN holds hundreds of unique patents, inventions and proprietary processes, all gained in the pursuit of optic and electronic innovation and customer success. (read more)
Controlled Plasticity Burnishing (CPB)
The same tools and control systems developed for low plasticity burnishing (LPB™) can of course be used to deliberately create higher amounts of cold work when warranted. (read more)
Conduct Research
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X-ray Diffraction Characterization Of Residual Stresses Produced By Shot Peening (.pdf)
A brief overview of the theory and practice of x-ray diffraction residual stress measurement as applied to shot peened materials is presented. The unique ability of x-ray diffraction methods to...(read more)
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The Use Of X-ray Diffraction To Determine The Triaxial Stress State In Cylindrical Specimens (.pdf)
A method of determining the axial, circumferential and radial residual stress distributions in cylindrical specimens is described. The axial and circumferential residual stresses are measured directly...(read more)
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X-ray Diffraction Residual Stress Techniques (.pdf)
In x-ray diffraction residual stress measurement, the strain in the crystal lattice is measured, and the residual stress producing the strain is calculated, assuming a linear elastic distortion of the...(read more)
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X-Ray Diffraction by Polycrystalline Materials
X-Ray Diffraction by Polycrystalline Materials Through both history and theory, this text presents a physical approach to the diffraction phenomenon and its applications in materials science, and...(read more)
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X-Ray Diffraction Characterization of Residual Stress and Hardness Distribution in Induction Hardened Gears (.pdf)
Accurate knowledge of the subsurface residual stress and hardness distributions is required for failure analysis, fatigue life prediction and process control of induction hardened components. X-ray...(read more)
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Current Applications Of X-ray Diffraction Residual Stress Measurement (.pdf)
A brief theoretical development of x-ray diffraction residual stress measurement is presented emphasizing practical engineering applications of the plane-stress model, which requires no external...(read more)
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Problems with Non-Destructive Surface X-ray Diffraction Residual Stress Measurement, Part 3 (.pdf)
This article concerning errors in the measurement of the surface stress caused by the penetration of the x-ray beam is the third and final article in a series addressing the difficulties encountered...(read more)
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Solid State X-ray Diffraction Detectors
Solid-state or semiconductor X-ray diffraction detectors collect diffracted intensity from one angle at a time and are scanned through the angular range of interest. These detectors provide the energy...(read more)
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A Method of Determining the Elastic Properties of Alloys in Selected Crystallographic Directions For X-Ray Diffraction Residual Stress Measurement (.pdf)
A technique and apparatus are described for obtaining the elastic constant E/(1 + ?) in selected crystallographic directions for the purpose of calibrating x-ray diffraction residual stress...(read more)
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X-ray Diffraction Characterization Of Crystallinity And Phase Composition In Plasma-sprayed Hydroxylapatite Coatings (.pdf)
Orthopedic and dental implants consisting of a metallic substrate plasma-spray coated with hydroxylapatite (HA) are currently used in reconstructive surgery. The crystalline phases present in the...(read more)
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X-ray - Wikipedia, the free encyclopedia X-ray From Wikipedia, the free encyclopedia For other uses, see X-ray (disambiguation). |
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1996 Building Publications - Pattern Fitting for Quantitative... Pattern Fitting for Quantitative X-Ray Powder Diffraction Analysis of Portland Cement and Clinker. |
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1996 Building Publications - Guide for X-Ray Powder... Guide for X-Ray Powder Diffraction Analysis of Portland Cement and Clinker. |
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Use of X-Ray Diffraction with the Gaussian Curve Method to... Use of X-Ray Diffraction with the Gaussian Curve Method to Evaluate the Hardening in Quenched Steels Kurita, M Associate ProfessorMember of ASTM, See ASTM International Information |
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ASTM E915 -96(2002) Standard Test Method for Verifying the... ASTM E915 - 96(2002) Standard Test Method for Verifying the Alignment of X-Ray Diffraction Instrumentation for Residual Stress Measurement See ASTM International Information |
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X-Ray Powder Diffraction X-Ray Diffraction Experiment INTRODUCTION |
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USGS: Science Topics: x-ray diffraction X-ray diffraction Study of crystals which uses short wave electromagnetic radiations (x-rays). The xrays, scattered by See U.S. Geological Survey Information |
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Vision Mission: The Black Hole Imager Use Diffraction Limited Normal Incidence Optics to make an X-ray Interferometer |
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Advanced Photon Source | Argonne National Laboratory A U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences national synchrotron x-ray research facility |
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Time-Resolved Electron and X-Ray Diffraction - SPIE's 1995... Ultrashort hard x-ray pulses for time-resolved x-ray diffraction Time-Resolved Electron and X-Ray Diffraction (Proceedings Volume) |
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