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The Engineering Toolbar
The Ultimate Resource for Engineering and Technical Research. (Learn More) |
Products/Services for near-field diffraction
X-ray diffraction instruments are used to measure crystal structure, grain size, texture and/or residual stress of materials and compounds through interaction of the X-ray beam with a sample. Search by Specification | Learn More about X-ray Diffraction Instruments
A diffraction grating uses a substrate with parallel grooves to disperse light into its spectra. Eschelles are included in this area. Search by Specification | Learn More about Diffraction Gratings
Ultrasonic horns and ultrasonic boosters are used with ultrasonic transducers and converters. Boosters or velocity transformers amplify ultrasonic vibrations. Ultrasonic horns, sonotrodes, anvils, blades or probes contact and transmit ultrasonic vibration. Learn More about Ultrasonic Horns and Boosters
Laser beam analyzers are used to determine the quality of a laser beam. Learn More about Laser Beam Analyzers
...or electrical field (electrozone). In the light blockage technique, a small volume of the sample is passed between a laser light source and a detector, and the shadows cast by the particles on the detector are measured. Diffraction or scattering is most... Search by Specification | Learn More about Particle Analyzers
...be differentiated by their use with different parts of the electromagnetic spectrum. For example, lenses used in ultraviolet (UV) applications are typically made of silica or synthetic quartz. By contrast, lenses designed for visible or near infrared (IR... Learn More about Optical Materials
Monochromators are optical subassemblies used to isolate narrow portions of a light spectrum. They accept polychromatic input from a lamp or laser, and outputs monochromatic light. Learn More about Monochromators
There are two major types of SMU semiconductor metrology instruments: capacitance measurement units (CMU) and picoammeter units (PAU). Reflectometers, resistance probes, resistance high-energy electron diffraction (RHEED) system, and X-ray diffractometers... Search by Specification | Learn More about Semiconductor Metrology Instruments
Specialty or proprietary equipment and accessories related to laboratory sample preparation. Learn More about Specialty Sample Preparation Equipment
...spectroscopy, chemical extraction, chromatography, combustion, deformulation or reverse engineering, diffraction, plasma emission spectroscopy, infrared spectroscopy, mass spectroscopy, microscopy, metallography, optical emission spectroscopy, particle size... Search by Specification | Learn More about Chemical Testing Services
...chromatography, combustion, deformulation or reverse engineering, diffraction, environmental testing, failure analysis, geotechnical services, plastic emission spectroscopy, infrared spectroscopy, mass spectroscopy, microscopy, metallography, non-destructive... Search by Specification | Learn More about Material Testing Services
...vessels such as oil tanks, providing site remediation and waste storage facility design. Geotechnical engineering services use field equipment and instrumentation for monitoring wells and groundwater, including submersible pumps, pH meters, portable... Search by Specification | Learn More about Geotechnical Services
...geological and environmental samples. They perform many different services. Examples include quantitative analysis, bioanalytical services, chemical testing, cleanroom testing, environmental exposure, environmental testing, failure analysis, field... Search by Specification | Learn More about Analytical Laboratory Services
...by hand or placed on a benchtop. Complete NDT material testing monitoring systems can continuously detect or measure flaws, thickness, or corrosion in production line, plant, production, or field applications. Non-destructive testing (NDT... Search by Specification | Learn More about Nondestructive Testing (NDT) Material Testers
Environmental testing and analytical services provide testing of environmental samples such as soil, water, air, and industrial wastes or byproducts. Search by Specification | Learn More about Environmental Testing and Analysis Services
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VTM Rheometer Dynisco Plastics
SE-Series Environmental Test Chambers Thermotron Industries
Multi Function Hardness Tester United Testing Systems, Inc.
Extensometers, United Model EZ United Testing Systems, Inc.
Super-Long-Beam Flex Tester United Testing Systems, Inc.
Tensile System with Heated Saline Bath United Testing Systems, Inc.
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Product News for near-field diffraction
NFS-200 / 300 Near-Field Spectrometer
Jasco is the first company to introduce a commercially available integrated Near-field Scanning Optical Spectrometer for Raman or Photoluminesence measurements. (read more)
The Fastest Dual Wavelength Diffraction System
Introducing the SuperNova™ The Fastest, Most Intense Dual Wavelength Diffraction System
The SuperNova is the first dual wavelength diffraction system to use entirely high intensity micro-source X-ray technology. (read more)
Residual Stress Analysis
Residual stresses are vital to the overall strength and life of critical components. Most processes involved in the manufacture of a component can cause residual stresses that will be either detrimental or beneficial to its strength and longevity. (read more)
XRK 900 Reactor Chamber from Anton Paar
XRK 900 is the only heating chamber for X-ray diffraction experiments on the market specifically designed for studies of solid state and solid state-gas reactions up to 900 °C and 10 bar. It is a unique tool for in-situ XRD investigations - unmatched in robustness and performance. (read more)
Measuring Sprays & Droplets, Measure Droplet Size
The new Malvern Spraytec spray sizing system provides users with in-situ, real-time measurements of the droplet size distributions produced by spray and aerosol devices. Using the technique of laser diffraction, it has been specifically designed to address the unique requirements of spray characterization, yielding robust... (read more)
NIR Analyzer - Spectral Dimensions SyNIRgi ™
The SyNIRgi, a new Near Infrared chemical imaging (NIRCI) product, builds on the highly successful Spectral Dimensions Sapphire/NIRCI-2450 platform. Rugged instrumentation with no moving parts, modular software that enables the development of turnkey solutions, and expandability for automation are the hallmarks of the SyNIRgi. (read more)
Particle Size Analyzer - Morphologi® G3
Knowledge and understanding of particle shape as well as size is now essential in the development and control of many industrial processes. The Morphologi® G3 automated particle characterization system from Malvern® Instruments is a new analytical tool that provides high quality, statistically significant particle size and shape information. (read more)
Mastersizer® 2000 Particle Size Analysis System
Malvern® Instruments' Mastersizer® 2000 helps Indorama fine tune PTA production.
Indorama Petrochem Limited have chosen the Mastersizer® 2000 particle size analysis system to provide quality control for the manufacture of Purified Terephthalic Acid (PTA) at their site in Rayong, Thailand. (read more)
Low-Volume Disposable Cuvette - Nano Series
New low-volume disposable cuvette extends protein analysis capabilities of the Zetasizer® Nano
A new low volume disposable polystyrene cuvette for the Malvern® Zetasizer Nano S and ZS particle characterization systems enables the size measurement of as little as 40 microlitres of sample. (read more)
Malvern On-Line Store - Now Open!
Our new on-line store is now open. Buy your consumables and training on-line today. Buy consumables and training for your Malvern analyzer on-line* (read more)
Conduct Research
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Nanospectroscopy Using a Near-Field Scanning Microspectrometer
Recent years have seen explosive growth in the use of organic materials, composites, or organics bound to an inorganic substrate, to solve engineering problems that traditionally were approached only...(read more)
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Diffraction - Wikipedia, the free encyclopedia which can be used to do this including the Fraunhofer diffraction equation for the far field and the Fresnel Diffraction equation for the near-field. |
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Microscopy - Wikipedia, the free encyclopedia 1.3 Sub-diffraction techniques 1.3.1 Near-field scanning Microscopy is the technical field of using microscopes to view samples or objects. |
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Physical Review E The x-ray pattern with azimuthally split signals at low angle region of diffraction is usually ... |
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Physical Review Special Topics - Accelerators and Beams in a form that is useful to both practitioners and people entering the field. |
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Vision Mission: The Black Hole Imager actual distortion of space-time by the intense, ultimate gravitational field. |
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Nanodot couplers provide efficient near-field energy transfer:... Driving such a device requires an external, conventional, diffraction-limited photonic mechanism with a far/near-field converter. |
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Far-field superlens imaging at visible wavelengths: SPIE... The near-field scanning optical microscope (NSOM)1,2 improves the resolution of an optical system by using a sharp probe placed close to the object |
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Extended edge wave diffraction model for near-field... Extended edge wave diffraction model for near-field directivity calculations of horn antennas |
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Ray Optical Electromagnetic Far-Field Scattering Computations... Ray Optical Electromagnetic Far-Field Scattering Computations Using Planar Near-Field Scanning Techniques |
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Near-Field Scanning Optical Microscopy (NSOM) Near-field Scanning Optical Microscopy (NSOM) |
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