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X-ray diffraction instruments are used to measure crystal structure, grain size, texture and/or residual stress of materials and compounds through interaction of the X-ray beam with a sample. Search by Specification | Learn More
A diffraction grating uses a substrate with parallel grooves to disperse light into its spectra. Eschelles are included in this area. Search by Specification | Learn More
...lies between the visible and microwave portions of the electromagnetic spectrum and has a range of wavelengths. Near infrared light is closest in wavelength to visible light. By contrast, far infrared light is closest to the microwave region. Mid... Search by Specification | Learn More
...display features include single screen (pass through) operation or dual screen operation, hardware image processor, hardware scaling, hardware region or interest, strobe output, strobe output, and acceptance or generation of video timing signals. Computer... Search by Specification | Learn More
...or attraction between particles. Particle analyzers may use blocking or attenuation, or diffraction or scattering techniques. Blockage or attenuation is based on a particle's ability to reduce the transmission of light, radiation (X-ray, beta... Search by Specification | Learn More
Optical materials consist of glasses, plastics, ceramics and coatings with reflectivity, opacity, color or other properties tailored for mirror, lens, laser or other optics applications. Learn More
Monochromators are optical subassemblies used to isolate narrow portions of a light spectrum. They accept polychromatic input from a lamp or laser, and outputs monochromatic light. Learn More
There are two major types of SMU semiconductor metrology instruments: capacitance measurement units (CMU) and picoammeter units (PAU). Reflectometers, resistance probes, resistance high-energy electron diffraction (RHEED) system, and X-ray diffractometers... Search by Specification | Learn More
Environmental testing and analytical services provide testing of environmental samples such as soil, water, air, and industrial wastes or byproducts. Search by Specification | Learn More
Helium neon (HeNe) lasers have an emission that is determined by neon atoms by virtue of a resonant transfer of excitation of helium. They operate continuously in the red, infrared and far-infrared regions and emit highly monochromatic radiation Search by Specification | Learn More
Tunnel diodes are heavily doped P-N diodes in which electron tunneling from the conduction band in the N-type material to the valence band in the P-type region produces a region of negative resistance. This negative-resistance region is the most Search by Specification | Learn More
Specialty or proprietary equipment and accessories related to laboratory sample preparation. Learn More
Other production processes use diffraction optics, fiber optics, laser optics, or polarizing optics. Diffraction optics uses the diffraction of light to manipulate light. Fiber optics conducts, amplifies, attenuates, multiplexes and switches light... Search by Specification | Learn More
...spectroscopy, chemical extraction, chromatography, combustion, deformulation or reverse engineering, diffraction, plasma emission spectroscopy, infrared spectroscopy, mass spectroscopy, microscopy, metallography, optical emission spectroscopy, particle size... Search by Specification | Learn More
...chromatography, combustion, deformulation or reverse engineering, diffraction, environmental testing, failure analysis, geotechnical services, plastic emission spectroscopy, infrared spectroscopy, mass spectroscopy, microscopy, metallography, non-destructive... Search by Specification | Learn More
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SE-Series Environmental Test Chambers Thermotron Industries
VTM Rheometer Dynisco Plastics
Puncture and Burst Testing United Testing Systems, Inc.
Fatigue to Failure Testing Rubber & Elastomers United Testing Systems, Inc.
RIECHERT R² MINI REFRACTOMETER Wilkens-Anderson Company
Custom Stability Chambers and Rooms BioCold Environmental, Inc.
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Introducing the SuperNova™ The Fastest, Most Intense Dual Wavelength Diffraction System
The SuperNova is the first dual wavelength diffraction system to use entirely high intensity micro-source X-ray technology. (read more)
Residual stresses are vital to the overall strength and life of critical components. Most processes involved in the manufacture of a component can cause residual stresses that will be either detrimental or beneficial to its strength and longevity. (read more)
XRK 900 is the only heating chamber for X-ray diffraction experiments on the market specifically designed for studies of solid state and solid state-gas reactions up to 900 °C and 10 bar. It is a unique tool for in-situ XRD investigations - unmatched in robustness and performance. (read more)
The new Malvern Spraytec spray sizing system provides users with in-situ, real-time measurements of the droplet size distributions produced by spray and aerosol devices. Using the technique of laser diffraction, it has been specifically designed to address the unique requirements of spray characterization, yielding robust... (read more)
The SyNIRgi, a new Near Infrared chemical imaging (NIRCI) product, builds on the highly successful Spectral Dimensions Sapphire/NIRCI-2450 platform. Rugged instrumentation with no moving parts, modular software that enables the development of turnkey solutions, and expandability for automation are the hallmarks of the SyNIRgi. (read more)
Knowledge and understanding of particle shape as well as size is now essential in the development and control of many industrial processes. The Morphologi® G3 automated particle characterization system from Malvern® Instruments is a new analytical tool that provides high quality, statistically significant particle size and shape information. (read more)
Malvern® Instruments' Mastersizer® 2000 helps Indorama fine tune PTA production.
Indorama Petrochem Limited have chosen the Mastersizer® 2000 particle size analysis system to provide quality control for the manufacture of Purified Terephthalic Acid (PTA) at their site in Rayong, Thailand. (read more)
New low-volume disposable cuvette extends protein analysis capabilities of the Zetasizer® Nano
A new low volume disposable polystyrene cuvette for the Malvern® Zetasizer Nano S and ZS particle characterization systems enables the size measurement of as little as 40 microlitres of sample. (read more)
Our new on-line store is now open. Buy your consumables and training on-line today. Buy consumables and training for your Malvern analyzer on-line* (read more)
The Sysmex FPIA-3000 enables reliable, repeatable and routine characterization of particle size distributions and particle shape distributions using automated imaging techniques. Particle shape information is generated from the analysis of a large number of particles, displays of size and shape data are supported by images... (read more)
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Diffraction - Wikipedia, the free encyclopedia Diffraction From Wikipedia, the free encyclopedia The intensity pattern formed on a screen by diffraction from a square aperture |
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Microscopy - Wikipedia, the free encyclopedia 1.3 Sub-diffraction techniques 1.3.1 Near-field scanning |
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Three dimensional modeling of double diffraction phenomena by... Keywords: double diffraction phenomena high building three dimensional modeling high frequency description navigation cellular radiotelephone radio |
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Diffraction-limited 1.3-/spl mu/m-wavelength... Diffraction-limited 1.3-/spl mu/m-wavelength tapered-gain-region lasers with >1-W CW output power |
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Vision Mission: The Black Hole Imager Use Diffraction Limited Normal Incidence Optics to make an X-ray Interferometer |
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Physical Review Special Topics - Accelerators and Beams |
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Physical Review E The x-ray pattern with azimuthally split signals at low angle region of diffraction is usually ... |
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High-frequency radio wave diffraction from singly curved,... |
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Threshold and resonance effects in diffraction gratings:... processes (since new diffraction orders stat to become propagating), the diffraction efficiency behavior within such a region is described and |
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Influence of phase delay profile on diffraction efficiency of... Analysis results show that flyback region size is the main factor that affects diffraction efficiency. |