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Products/Services for diffraction ray
X-ray diffraction instruments are used to measure crystal structure, grain size, texture and/or residual stress of materials and compounds through interaction of the X-ray beam with a sample. Search by Specification | Learn More
X-ray fluorescence spectrometers (XRFs) use a spectroscopic technique that is commonly used with solids, in which X-rays are used to excite a sample and generate secondary X-rays. Search by Specification | Learn More
X-ray instruments and X-ray systems use penetrating X-rays or gamma radiation to capture images of the internal structure of a part or finished product. Search by Specification | Learn More
A diffraction grating uses a substrate with parallel grooves to disperse light into its spectra. Eschelles are included in this area. Search by Specification | Learn More
X-ray tubes and X-ray sources are lamps that produce X-rays. Learn More
...or brightness, thermal or infrared, multi-spectral, optical microscopes, x-ray, UV or fluorescence, confocal laser, electron microscope, ultrasonic or acoustic, and magnetic imaging. Search by Specification | Learn More
Portable / Miniature, visible, infrared (IR), ultraviolet (UV), atomic absorption (AA), optical emission (OE), Raman, X-ray fluorescence (XRF Search by Specification | Learn More
Radiation shielding is used to block or attenuate the intensity of alpha particles (helium atoms), beta particles (electrons), X-ray radiation, and gamma radiation (energetic electromagnetic radiation). Learn More
, magnetometers, optical systems, profilometers, reflectometers, resistance probes, RHEED systems, and X-ray diffractometers. Search by Specification | Learn More
Imaging workstations are vision systems used for metrology or image analysis in laboratory and cleanroom settings. Search by Specification | Learn More
...and retrieve beams of high frequency acoustic energy. By contrast, infrared (IR) NDT material testers transmit or reflect radiation in order to determine absorption levels. X-ray diffraction and X-ray fluorescence are other non-destructive, radiographic test... Search by Specification | Learn More
...ray fluorescence analysis. A laser preparation sample may be a powdered specimen sample or a biological specimen treated with specific nucleic acids or proteins. Laboratories that use specialty sample preparation equipment have a variety... Learn More
...or attraction between particles. Particle analyzers may use blocking or attenuation, or diffraction or scattering techniques. Blockage or attenuation is based on a particle's ability to reduce the transmission of light, radiation (X-ray, beta... Search by Specification | Learn More
...of products: cathode ray tube (CRT) monitors and flat panel displays (FPD). CRTs are sealed, glass tubes that generate light from an electron beam. The beam is produced by the acceleration of electrons from a heated cathode and grid towards the front... Search by Specification | Learn More
...ray instruments and diffractometers. Test equipment and instrument repair services meet various quality requirements, approvals and certifications. These standards are formulated by organizations such as the International Standards Organization... Search by Specification | Learn More
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VTM Rheometer Dynisco Plastics
SE-Series Environmental Test Chambers Thermotron Industries
Multi Function Hardness Tester United Testing Systems, Inc.
Ocean oil rigs withstand major storms AJT Equipment Limited
Vertical Plane Tensile Testing Machine AJT Equipment Limited
Used & Pre-Owned Hardness & Tensile Testers United Testing Systems, Inc.
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Product News for diffraction ray
The Fastest Dual Wavelength Diffraction System
Introducing the SuperNova™ The Fastest, Most Intense Dual Wavelength Diffraction System
The SuperNova is the first dual wavelength diffraction system to use entirely high intensity micro-source X-ray technology. (read more)
X-Ray Power Supplies
LHV Power (FKA Hitek Power) X-ray power supplies, designed to meet many inspection and analytical applications, power range capability from the top of the range 2kW Series XR2000 down to low power 50W Model XFR50 module.
These X-ray power supplies are used in industrial X-ray checking and inspection systems, X-ray diffraction (XRD) and X-ray fluorescence (XFR) analysis, as well as in (read more)
Custom X-ray Instruments and X-ray Systems
VJ Technologies, Inc. offers leading-edge solutions for the most advanced X-ray imaging applications. They offer custom X-ray Instruments and X-ray System solutions. (read more)
Custom X-ray Instruments and X-ray Systems
For over 160 years ELCAN has been a leader in the advancement of imaging, from the very first 35 mm cameras to the very latest in digital radiography. ELCAN holds hundreds of unique patents, inventions and proprietary processes, all gained in the pursuit of optic and electronic innovation and customer success. (read more)
PXS10-65W/PXS10-800 130 kV MicroFocus X-ray Source
The PXS10-65W and PXS10-800 are MicroFocus X-Ray sources for applications requiring high power and high resolution. They operate from 45kV-130kV at up to 65W. They offer <6µm spot size and FOD of 14mm for excellent resolution and magnification. The completely integrated units combine a sealed tube, high voltage power supply and digital controller in a compact package. (read more)
PXS10-16W 130 kV MicroFocus X-ray Source
The PXS10-16W is a MicroFocus X-Ray source for applications requiring the highest resolution. It operates from 45kV - 130kV at up to 16W. It offers focal spot size down to <5µm and a focus-to-object distance of 14mm for excellent resolution and magnification. The completely integrated unit combines a sealed tube, high voltage power supply and digital controller in a compact package. (read more)
PXS5-925EA, 90 kV MicroFocus X-Ray Source
The PXS5-925EA is a MicroFocus X-Ray source for high resolution radiographic applications and real time imaging. It operates from 45kV-90kV at up to 8W. It features a focal spot down to 7µm and a Focus-to-Object Distance (FOD) of 12mm for excellent resolution and magnification. The compact case houses an end-window sealed tube and high voltage power supply in a unit weighing only 8lbs. (read more)
PXS5-724EA, 70 kV MicroFocus X-Ray Source
The PXS5-724EA is an end-window MicroFocus X-Ray source for high resolution radiographic applications and real time imaging. It operates from 45kV - 70kV at up to 7W. The focal spot is <20µm at 7W and the Focus-to-Object Distance (FOD) is 12.5mm giving excellent resolution and magnification. The compact case houses a sealed tube and high voltage power supply in a unit weighing only 7lbs. (read more)
PXS5-927, 90 kV MicroFocus X-Ray Source
The PXS5-927 is a MicroFocus X-Ray source for applications requiring the highest resolution. It operates from 20kV - 90kV at up to 8W. It features a round focal spot with size down to 4µm and a working distance of 8.5mm for outstanding resolution and magnification. The completely integrated unit combines a sealed tube, high voltage power supply and digital controller in a compact package. (read more)
PXS5-822SA, 80 kV MicroFocus X-Ray Source
The PXS5-822SA is a side-window MicroFocus X-Ray source for high resolution radiographic applications and real time imaging. It operates from 45kV - 80kV at up to 8W. The focal spot is <20µm at 8W and the Focus-to-Object Distance (FOD) is 12.5mm giving excellent resolution and magnification. The compact case houses a sealed tube and high voltage power supply in a unit weighing only 7lbs. (read more)
Conduct Research
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X-ray Diffraction Characterization Of Residual Stresses Produced By Shot Peening (.pdf)
A brief overview of the theory and practice of x-ray diffraction residual stress measurement as applied to shot peened materials is presented. The unique ability of x-ray diffraction methods to...(read more)
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The Use Of X-ray Diffraction To Determine The Triaxial Stress State In Cylindrical Specimens (.pdf)
A method of determining the axial, circumferential and radial residual stress distributions in cylindrical specimens is described. The axial and circumferential residual stresses are measured directly...(read more)
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X-ray Diffraction Residual Stress Techniques (.pdf)
In x-ray diffraction residual stress measurement, the strain in the crystal lattice is measured, and the residual stress producing the strain is calculated, assuming a linear elastic distortion of the...(read more)
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X-Ray Diffraction by Polycrystalline Materials
X-Ray Diffraction by Polycrystalline Materials Through both history and theory, this text presents a physical approach to the diffraction phenomenon and its applications in materials science, and...(read more)
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X-Ray Diffraction Characterization of Residual Stress and Hardness Distribution in Induction Hardened Gears (.pdf)
Accurate knowledge of the subsurface residual stress and hardness distributions is required for failure analysis, fatigue life prediction and process control of induction hardened components. X-ray...(read more)
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Current Applications Of X-ray Diffraction Residual Stress Measurement (.pdf)
A brief theoretical development of x-ray diffraction residual stress measurement is presented emphasizing practical engineering applications of the plane-stress model, which requires no external...(read more)
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Problems with Non-Destructive Surface X-ray Diffraction Residual Stress Measurement, Part 3 (.pdf)
This article concerning errors in the measurement of the surface stress caused by the penetration of the x-ray beam is the third and final article in a series addressing the difficulties encountered...(read more)
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Solid State X-ray Diffraction Detectors
Solid-state or semiconductor X-ray diffraction detectors collect diffracted intensity from one angle at a time and are scanned through the angular range of interest. These detectors provide the energy...(read more)
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A Method of Determining the Elastic Properties of Alloys in Selected Crystallographic Directions For X-Ray Diffraction Residual Stress Measurement (.pdf)
A technique and apparatus are described for obtaining the elastic constant E/(1 + ?) in selected crystallographic directions for the purpose of calibrating x-ray diffraction residual stress...(read more)
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Problems With Non-destructive Surface X-ray Diffraction Residual Stress Measurement (.pdf)
Because surface measurements are non-destructive, xray diffraction is often considered as a method of residual stress measurement for quality control testing. Unfortunately, errors caused by the...(read more)
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X-ray - Wikipedia, the free encyclopedia X-ray From Wikipedia, the free encyclopedia For other uses, see X-ray (disambiguation). |
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1996 Building Publications - Pattern Fitting for Quantitative... Pattern Fitting for Quantitative X-Ray Powder Diffraction Analysis of Portland Cement and Clinker. |
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1996 Building Publications - Guide for X-Ray Powder... Guide for X-Ray Powder Diffraction Analysis of Portland Cement and Clinker. |
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Use of X-Ray Diffraction with the Gaussian Curve Method to... Use of X-Ray Diffraction with the Gaussian Curve Method to Evaluate the Hardening in Quenched Steels Kurita, M Associate ProfessorMember of ASTM, See ASTM International Information |
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ASTM E915 -96(2002) Standard Test Method for Verifying the... ASTM E915 - 96(2002) Standard Test Method for Verifying the Alignment of X-Ray Diffraction Instrumentation for Residual Stress Measurement See ASTM International Information |
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X-Ray Powder Diffraction X-Ray Diffraction Experiment INTRODUCTION |
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USGS: Science Topics: x-ray diffraction X-ray diffraction Study of crystals which uses short wave electromagnetic radiations (x-rays). The xrays, scattered by See U.S. Geological Survey Information |
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Vision Mission: The Black Hole Imager Use Diffraction Limited Normal Incidence Optics to make an X-ray Interferometer |
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Advanced Photon Source | Argonne National Laboratory A U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences national synchrotron x-ray research facility |
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Time-Resolved Electron and X-Ray Diffraction - SPIE's 1995... Ultrashort hard x-ray pulses for time-resolved x-ray diffraction Time-Resolved Electron and X-Ray Diffraction (Proceedings Volume) |
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