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Products/Services for diffraction peak
X-ray diffraction instruments are used to measure crystal structure, grain size, texture and/or residual stress of materials and compounds through interaction of the X-ray beam with a sample. Search by Specification | Learn More
A diffraction grating uses a substrate with parallel grooves to disperse light into its spectra. Eschelles are included in this area. Search by Specification | Learn More
...common specific parameters for surface profilometers. Examples include: roughness average, mean peak-to-valley height, base roughness depth, maximum peak height, average peak profile height, maximum valley depth, total roughness height, profile depth... Search by Specification | Learn More
...or attraction between particles. Particle analyzers may use blocking or attenuation, or diffraction or scattering techniques. Blockage or attenuation is based on a particle's ability to reduce the transmission of light, radiation (X-ray, beta... Search by Specification | Learn More
Optical materials consist of glasses, plastics, ceramics and coatings with reflectivity, opacity, color or other properties tailored for mirror, lens, laser or other optics applications. Learn More
Monochromators are optical subassemblies used to isolate narrow portions of a light spectrum. They accept polychromatic input from a lamp or laser, and outputs monochromatic light. Learn More
There are two major types of SMU semiconductor metrology instruments: capacitance measurement units (CMU) and picoammeter units (PAU). Reflectometers, resistance probes, resistance high-energy electron diffraction (RHEED) system, and X-ray diffractometers... Search by Specification | Learn More
...chromatography, combustion, deformulation or reverse engineering, diffraction, environmental testing, failure analysis, geotechnical services, plastic emission spectroscopy, infrared spectroscopy, mass spectroscopy, microscopy, metallography, non-destructive... Search by Specification | Learn More
Specialty or proprietary equipment and accessories related to laboratory sample preparation. Learn More
...or the “size” of the spectra on the array. Resolution, a measure of an instrument’s ability to separate two overlapping peaks, is the width of an analytical peak at half its height. Typically, resolution is measured in nanometers (nm... Search by Specification | Learn More
Digital voltmeters are instruments that measure voltage or voltage drop in a circuit. They use solid-state components and display values digitally. Search by Specification | Learn More
...spectroscopy, chemical extraction, chromatography, combustion, deformulation or reverse engineering, diffraction, plasma emission spectroscopy, infrared spectroscopy, mass spectroscopy, microscopy, metallography, optical emission spectroscopy, particle size... Search by Specification | Learn More
...testing, atomic absorption spectroscopy (AA), chemical extraction, chromatography, combustion analysis, deformulation or reverse engineering, diffraction, inductively coupled plasma (ICP), infrared spectroscopy (FTIR), isotopic analysis, mass spectroscopy... Search by Specification | Learn More
...on the array. Spectral resolution is the width of an analytical peak at half its height as measured in nanometers (nm). This value indicates the spectrometer’s ability to separate two overlapping peaks. Spectral accuracy is the agreement between... Search by Specification | Learn More
Product and component testing services is the evaluation of a finished product or component through performance in electrical, life, environmental exposure, dynamic, ergonomic or other specialized tests. Also testing to standards such as UL 489, CE or MIL-STD 810. Search by Specification | Learn More
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SE-Series Environmental Test Chambers Thermotron Industries
VTM Rheometer Dynisco Plastics
Cold Rooms BioCold Environmental, Inc.
Environmental Chambers United Testing Systems, Inc.
Critical Storage - Redundant Systems BioCold Environmental, Inc.
Hardness Tester meets ASTM ISO NIST requirements United Testing Systems, Inc.
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Product News for diffraction peak
Residual Stress Analysis
Residual stresses are vital to the overall strength and life of critical components. Most processes involved in the manufacture of a component can cause residual stresses that will be either detrimental or beneficial to its strength and longevity. (read more)
The Fastest Dual Wavelength Diffraction System
Introducing the SuperNova™ The Fastest, Most Intense Dual Wavelength Diffraction System
The SuperNova is the first dual wavelength diffraction system to use entirely high intensity micro-source X-ray technology. (read more)
Retained Austenite Measurement
Hardening of steels requires heating to an austenitic phase and quenching to room temperature to produce a hard martensitic phase. Due to incomplete transformation some austenite is retained at room temperature. Retained austenite can have a detrimental affect on the mechanical properties of the steel... (read more)
Peak G-Level, Date, & Time Recorder
The SnapShock® 4000 is a compact, battery powered, single axis peak acceleration, date, and time recorder. The instrument measures and records the peak acceleration (shock or vibration) levels to which it is exposed, along with their date and times of occurrence. (read more)
Ultracaps Provide Peak Green Power Delivery
When paired with low cost batteries, ultracapacitors provide peak power delivery required to transmit signals. Studies have demonstrated that a simple parallel connection of an ultracapacitor to a low-cost alkaline battery can duplicate the performance characteristics of a lithium-ion battery. (read more)
300W & 600W Supplies Deliver 300% Peak Power
Lambda's new series of 300W and 600W power supplies deliver up to 300% peak output power. The AC-DC single-output HWS300P and HWS600P series are ideal for powering industrial equipment that demands high peak currents (e.g., motors, pumps), ultra-reliability, and extended field-life. All HWS series supplies come with Lambda Americas' exclusive Limited-Lifetime-Warranty. (read more)
Coaxial Terminations - Up to 10 kW Peak RF Power
Narda East introduces the Model 368BNM and Model 369BNM coaxial terminations that operate from 2 to 18 GHz and 700 MHz to 18 GHz respectively, and are extremely rugged for use in applications ranging from instrumentation to transmitters in the field. (read more)
XRK 900 Reactor Chamber from Anton Paar
XRK 900 is the only heating chamber for X-ray diffraction experiments on the market specifically designed for studies of solid state and solid state-gas reactions up to 900 °C and 10 bar. It is a unique tool for in-situ XRD investigations - unmatched in robustness and performance. (read more)
Measuring Sprays & Droplets, Measure Droplet Size
The new Malvern Spraytec spray sizing system provides users with in-situ, real-time measurements of the droplet size distributions produced by spray and aerosol devices. Using the technique of laser diffraction, it has been specifically designed to address the unique requirements of spray characterization, yielding robust... (read more)
Crystallographic Texture & ODF Analysis
Lambda Technologies has extensive experience determining the crystallographic "texture," or preferred orientation, in a wide variety of materials and forms. Much of the instrumentation and virtually all of the data collection software have been developed in our laboratory to meet the specific specimens and testing requirements of our clients... (read more)
Conduct Research
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X-Ray Diffraction Characterization of Residual Stress and Hardness Distribution in Induction Hardened Gears (.pdf)
Accurate knowledge of the subsurface residual stress and hardness distributions is required for failure analysis, fatigue life prediction and process control of induction hardened components. X-ray...(read more)
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Simultaneous Determination of Residual Stress and Hardness in Steels (.pdf)
X-ray diffraction can be used to determine, simultaneously and independently, both macroscopic and microscopic residual stresses. Macrostresses extend over distances large compared to the grain size,...(read more)
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The Use of Pearson Vii Distribution Functions in X-Ray Diffraction Residual Stress Measurement (.pdf)
The fitting of a parabola by least squares regression to the upper portion of diffraction peaks is commonly used for determining lattice spacing in residual stress measurement. When Ka techniques are...(read more)
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X-Ray Diffraction Determination of Subsurface Cold Work Distributions (.pdf)
Cold working of metals produces extensive dislocation networks within individual grains. The dislocation networks define "crystallites" which are nearly perfectly crystalline subgrains. As the percent...(read more)
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Understanding Spatial Filters
Spatial Filters are designed to be used with lasers to "clean up" the beam. Often times a laser system does not produce a beam with a smooth intensity profile. In order to produce a clean Gaussian...(read more)
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MATLAB Central - Files antennas communications diffraction difraction fraunhofer function gui image generation model prevision loss propagation models radiowave rectangular See MathWorks, Inc. (The) Information |
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MATLAB Central - Files chemistry, physics, peak value, xray diffraction, data, function See MathWorks, Inc. (The) Information |
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ASTM E915 -96(2002) Standard Test Method for Verifying the... The specimen must be sufficiently fine-grained so that large numbers of individual crystals contribute to the diffraction peak produced. See ASTM International Information |
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Use of X-Ray Diffraction with the Gaussian Curve Method to... The sharpness of the diffraction line peak can be measured by using a constant of the Gaussian curve fitted to the peak. See ASTM International Information |
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Powder Diffraction at SSRL Powder Diffraction Table of Contents: Introduction to Powder Diffraction : Why do Powder Diffraction at a Synchrotron Source? |
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Neutron Diffraction Macro Residual Stress Mapping Facility The particular monochromator crystal and diffraction angle are selected to locate a particular diffraction peak around 90 degrees 2-theta. |
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Physical Review Special Topics - Accelerators and Beams |
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Melting in a Superconductor | Physical Review Focus Crystal: Direct Evidence for a Phase Transition at the Peak Effect from Neutron Diffraction X. S. Ling, S. R. Park, B. A. McClain, S. M. Choi, D. C. |
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ASTM D3906-03(2008) Standard Test Method for Determination... |
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Issues and Controversy: Measurement of Crystalline Silica -... Equations The fundamental equations of quantitative X-ray powder diffraction analysis were first formulated by Alexander and Klug (1948). For a phase See Occupational Safety & Health Administration (OSHA) Information |
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