|
|
|
Welcome to GlobalSpec - a trusted source for engineers and industrial professionals.
Search GlobalSpec to find chip test-related products, suppliers, datasheets and CAD.
 |
The Engineering Toolbar
The Ultimate Resource for Engineering and Technical Research. (Learn More) |
- Find Products/Services
- Find Product News
- Find Parts by Number
- Conduct Research
- Engineering Web Search
Products/Services for chip test
Battery and fuel cell test equipment consists of specialized test stations, stands or systems, monitors and component modules for performance or endurance testing. Search by Specification | Learn More
Automated test equipment (ATE) is used to monitor and control test and measurement devices, keeping human interaction at a minimum. Search by Specification | Learn More
Environmental exposure (climatics) testing services use humidity, pressure, temperature, vibration, exposure to ultraviolet light (UV) and other climatic variables to test samples, parts and components, and finished products. Search by Specification | Learn More
Product and component testing services is the evaluation of a finished product or component through performance in electrical, life, environmental exposure, dynamic, ergonomic or other specialized tests. Also testing to standards such as UL 489, CE or MIL-STD 810. Search by Specification | Learn More
Polymer test equipment includes melt flow indexers, extrusiometers, and other specialized instruments for determining the processability and properties of plastics and elastomer materials. Search by Specification | Learn More
Electric test probes are used to establish a connection between a circuit under test and the measuring instrument. Search by Specification | Learn More
Mechanical testing equipment covers devices used for adhesion, compression, drop (shock), tensile, vibration and fatigue testing. Search by Specification | Learn More
...instruments. Examples include wafer probers, imaging stations, ellipsometers, and CD-SEMs. A wafer prober is used to test a semiconductor wafer before it is separated into individual dies or chips. An ellipsometer determines the properties and surfaces... Search by Specification | Learn More
Hardness testers measure a material's resistance to indentation. This calculation is determined by measuring the permanent depth or projected area of the indentation. Search by Specification | Learn More
Shock and vibration (dynamics) testing services or dynamics testing of a finished product or component using shock, sine and random vibration or other dynamic test conditions. Search by Specification | Learn More
Environmental test chambers and rooms are used to ensure the reliability of industrial products, especially electronic items, through prolonged exposure to one or more environmental parameters. Search by Specification | Learn More
Pulp and paper testers include specialized sensors, instruments, COBB testers, and test equipment for evaluating the material properties and processability characteristics of pulp and paper. Search by Specification | Learn More
Ground bond testers are electrical safety test devices that perform electrical compliance tests. Search by Specification | Learn More
Wire harness testers evaluate continuity, resistance, isolation, and other performance factors for multi-strand wire harnesses. Search by Specification | Learn More
Electronics test fixtures are used to test contact points on circuit boards during manual or automated testing. Learn More
|
||||||||
Hioki 3554 Hand-Held Battery HiTester Fotronic Corporation / Test Equipment Depot
Continuous Load Units Albér
SBS Battery Room Hydrogen Sensor Storage Battery Systems, Inc.
SBS RT-100 Micro-Ohmeter Storage Battery Systems, Inc.
TES-33 Battery Capacity Tester TES Electrical Electronic Corp.
RM-650 Recharge Module Albér
|
Product News for chip test
EZ-TEST AC Hipot Tester
The EZ-TEST™ Tool is a light weight, powerful low frequency AC Hipot Tester, which facilitates quick, easy and safe AC Hipot tests of URD power cables. (read more)
Drop impact tester for testing Pipelines
The transporting of petroleum, petroleum products, or other substances in pipelines is one of the most efficient and safest ways of transportation, and since pipeline engineering must meet very high safety standards these are constantly being developed. The continuous growth in pipeline networks means that materials testing is becoming more and more important (read more)
Hipot-Insulation Resistance-Ground Bond Testers
The GPT/GPI-800 Electrical Safety Testers (EST) are Hipot Testers designed for AC/DC Withstanding Voltage testing and Insulation Resistance (IR) testing to provide electrical safety compliance testing and certification to JIS, CSA, UL, BS, EN, etc. The Ground Bond Tester, GCT, provides 32 A of Test Current. (read more)
Sentry 10 | 20 | 30 PLUS Series Hipot Testers
The Sentry Plus instruments provide a complete dielectric testing solution. The Sentry 10 Plus for AC Hipot testing, the Sentry 20 Plus for AC/DC Hipot testing and the Sentry 30 Plus for AC and DC Hipot tests plus IR measurements. (read more)
Production Hipot Testers with RS-232 Interface
Hypot® III is a mid range family of Hipot testers that feature an RS-232 interface, enhanced graphic LCD. Hypot III consists of three models the 3705, the 3765, and the 3770. Models will perform AC, DC Hipot and Insulation Resistance tests. (read more)
Electrical Safety Testers
The OMNIA series are UL and TUV listed fully automated multi-function electrical safety compliance analyzers for safety agency production line testing. The OMNIA series features 4-in-1, 5-in-1 and 6-in-1 models that will perform AC Hipot, DC Hipot, Insulation Resistance, Ground Bond, Functional Run and Line Leakage tests. (read more)
Automated Hipot Testers!
HypotULTRA™ III is a fully-automated dielectric analyzer for safety agency production line testing. It features two models, the 7620 and the 7650 and will perform AC, DC Hipot and Insulation Resistance testing. HypotULTRA III provides a complete offering of automation interfaces including ethernet! (read more)
Guardian 1000 Series Hipot Testers
Safe High Voltage Testing doesn't have to be an oxymoron. The digital Guardian 1000 Series Hipot Testers include GFI, Quick Discharge and HV Output Cutoff plus other safety features. (read more)
Ground Bond Testers
The HYAMP III family are manual Ground Bond testers that feature an enhanced graphic LCD. They consist of a 30 Amp, 40 Amp, and 60 Amp models. All models can be used stand alone or interconnected to the Hypot® III family of Hipot testers to form a complete test system. They can also be controlled through enhanced PLC Remote Control. (read more)
AUTOMATIC PETROLEUM TESTERS
Automatic Petroleum Testers for Color Measurement, Distillation, Pour/Cloud Point, Aniline Point, Plugging Point, Carbon Residue, Micro Carbon Residue, Vapor Pressure, X-Ray Sulfur Meter (read more)
Parts by Number for chip test
| Part # | Distributor | Manufacturer | Product Category | Description |
|---|---|---|---|---|
| 10 | Digi-Key | Jelight Company | Test Equipment | ERASER CHIP HOLDS 12 ICS |
| ACM4532-801-2P-T001 | Newark | TDK | Inductors, Chokes & Coils | ; Inductor Type:Chip; Series:ACM4532; DC Resistance Max:100Mohm; DC Current Rating:1A; Self Resonant Frequency:-003MHz; Package/Case:4532; Q Factor:-003; Resistance:0.1ohm; Test Frequency:100MHz; Voltage, DC:50V RoHS Compliant: Yes |
Conduct Research
-
System-on-Chip Test Architectures: Nanometer Design for Testability
System-on-Chip Test Architectures: Nanometer Design for Testability A comprehensive guide to new VLSI Testing and Design-for-Testability techniques, this text will allow you to master...(read more)
-
Introduction to Advanced System-on-Chip Test Design and Optimization
Introduction to Advanced System-on-Chip Test Design and Optimization Shedding light on the many issues that come to play in the arena of modular SOC testing, this book describes the problems...(read more)
-
Bellows let chip testers run hot and cold
The S-170, made by Aseco Corp. in Marlboro, Mass., accepts chips loaded on two, four-track aluminum magazines, then singulates them into a large thermal soak chamber. Corrosion-resistant nickel...(read more)
-
Helping chips keep their cool
Two-phase flow cooling comes to high-power electronics. Ron Hoover and Fred Phillips Thermacore International Inc. A Div. of Modine Packing more transistors into ICs and running them faster boosts...(read more)
-
Vacuum systems accelerate chip production
Advances in controls and networks combined with components that pack more punch have opened the door to more-precise, durable, and economical pneumatic systems. Like most manufacturers today, the...(read more)
-
JTAG Testing and Boundary-Scan Testing
JTAG testing and boundary-scan testing are used by automatic test equipment (ATE) for surface mount technology (SMT) and on-chip circuitry. These test techniques allow complete controllability and...(read more)
-
Automated Test Platform
Automated test platforms are designed to check chips make sure they work, and if so, how well (usually how fast) they perform. Automated test platforms are usually specialized as either memory chip...(read more)
-
Production Testing of RF and System-On-a-Chip Devices for Wireless Communications
Production Testing of RF and System-On-a-Chip Devices for Wireless Communications Addressing the need for a merger of RF and mixed-signal test approaches head-on, this text offers an overview of...(read more)
-
How Triz solved a sticky little IC problem
After one workshop, engineers with National Semiconductor, Santa Clara, Calif., modified a machine that tests integrated circuits with what they considered innovative solutions to problems that had...(read more)
-
Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits: The System on Chip Approach
Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits: The System on Chip Approach Providing a comprehensive discussion of automatic testing, diagnosis and tuning of analogue,...(read more)
|
Agilent | United States Home -- please select -- Life Sciences & Chemical Analysis Electronic Test & Measurement About Agilent See Agilent Technologies, Inc. / Electronic Measurement Group Information |
|
|
August 2002 EEELinks Assessment of Flip-Chip Advanced Test Assembly Electronics Packages Under Extreme Temperature Applications |
|
|
USB.org - Documents Inter-Chip USB Supplement Revision 1.0 as of March 13, 2006 See USB Implementers Forum, Inc. Information |
|
|
Aries Electronics - Your Best Source for Interconnection and... Correct-A-Chip? Adapters ZIF Burn-in & Test Sockets ZIF Test Sockets Hi-Frequency (RF) Sockets See Aries Electronics, Inc. Information |
|
|
ARM - The Architecture for the Digital World 08 Oct 2009 / ARM Announces 45nm SOI Test Chip Results That Demonstrate Potential 40 Percent Power Savings Over Bulk Process See ARM, Inc. Information |
|
|
Xilinx WP276 Programmable Development and Test, white paper fact that the devices can be configured with test applications during the development and production test stage. See Xilinx, Inc. Information |
|
|
Test & Measurement For example, in high-end, chassis based communications or video broadcast test equipment, a designer can use the Virtex-II Pro series of FPGAs to See Xilinx, Inc. Information |
|
|
Amkor Technology: Amkor Technology: Semiconductor IC Test |... SuperFC (Super Flip Chip) Amkor's SuperFC® is THE high performance flip chip solution. See Amkor Technology Information |
|
|
Aeroflex Corporation - Aeroflex 7100 LTE Digital Radio Test Set The 7100 provides all the tools Test Solutions Group Microelectronic Solutions Group See Aeroflex Incorporated Information |
|
|
Top Five Trends in Test and Measurement - Developer Zone -... functional test more closely related to testing components placed on a printed circuit board than a typical vector-based chip test, but they still |
More >>
