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Products/Services for Backscattering
X-ray diffraction instruments are used to measure crystal structure, grain size, texture and/or residual stress of materials and compounds through interaction of the X-ray beam with a sample. Search by Specification | Learn More
Fiber optic probes collect light or spectra from extreme environments inside reaction vessels at high temperatures or pressures. Product types include UV-Vis spectroscopy probes, Raman spectroscopy probes, and refractometry probes. Search by Specification | Learn More
Optical isolators are passive optical devices that allow light to be transmitted in only one direction. They are most often used to prevent any light from reflecting back down the fiber, as this light would enter the source and cause backscattering... Search by Specification | Learn More
Instruments such as quartz crystal microbalance (QCM) monitors, ellipsometers, RHEED systems, imaging stations, CD-SEMs, ion mills, C-V systems specifically designed for wafer metrology or in-situ monitoring of thin film parameters during thin film or semiconductors wafer processing. Search by Specification | Learn More
Semiconductor metrology instruments are designed for wafer and thin film in-line inspection after semiconductor processing. They include capacitance gages, C-V systems, electron beam probes, ellipsometers, interferometers, I-V system, magnetometers, optical systems, profilometers, reflectometers, resistance probes, RHEED systems, and X-ray diffractometers. Search by Specification | Learn More
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SE-Series Environmental Test Chambers Thermotron Industries
VTM Rheometer Dynisco Plastics
Ocean oil rigs withstand major storms AJT Equipment Limited
2000 tonne Horizontal Tensile Test Machine AJT Equipment Limited
Used & Pre-Owned Hardness & Tensile Testers United Testing Systems, Inc.
Tensile System with Heated Saline Bath United Testing Systems, Inc.
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Product News for Backscattering
Beta Backscatter Method for Many Applications
Beta Backscatter method offers a great deal of versatility and can be used to measure: paint, oil, lubricating films, plastic, enamel, ceramic and phosphate coatings on metals and some non-metals. Also metal coatings on other metals, including some coatings too thick for X-ray test methods. (read more)
Plastic Coated Silica/Silica (Low OH)
When looking for a high quality fiber with superior transmission and a numerical aperture (N.A.) of 0.22 for efficient light coupling, the Anhydroguide™ AFS is the fiber of choice. The Anhydroguide™ fiber is drawn from preforms manufactured by the Plasma Outside Deposition (POD) process. (read more)
Plastic Coated Silica/Silica (Standard OH)
When looking for a high quality fiber with superior transmission and a numerical aperture (N.A.) of 0.22 for efficient light coupling, the Superguide™ SFS is the fiber of choice. The Superguide™ fiber is drawn from preforms manufactured by the Plasma Outside Deposition (POD) process. (read more)
Multi Measurement System for NDT
FISCHERSCOPE® MMS® PCB: Three in one instrument A universal measurement system for determining copper coatings and other electroplated coatings on pc-boards on surface areas and in boreholes. (read more)
DUALSCOPE® FMP40 Coating Thickness Gauge
DUALSCOPE® FMP40 is designed with built-in measurement reporting to meet the requirements set forth by SSPC-PA2 and IMO PSPC (read more)
X-ray Spectrometer for Quantitative Analysis
X-Ray Fluorescence Instruments for WEEE/RoHS by Fischer Technology The FISCHERSCOPE X-RAY XAN and XDAL identify the content of prohibited metals in compliance to the EU directive RoHS/WEEE (read more)
Solutions for Consumer Protection Safety Act
The FISCHERSCOPE® X-RAY XDV®-SD X-ray fluorescence spectrometer supports the challenges that manufacturers face while screening for hazardous substances per the Consumer Product Improvement Safety Act of 2008. (read more)
Conduct Research
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Hitachi Backscatter Detector for S-3000 Series SEMs
Backscattered Electron Detector Secondary electron images are the most frequently obtained images from the SEM. However, the backscattered electron (BSE) image provides important information and in...(read more)
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Passive RFID Basics
Radio Frequency Identification (RFID) systems use radio frequency to identify, locate and track people, assets, and animals. Passive RFID systems are composed of three components an interrogator...(read more)
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Explanation of the Principles Used in Single Point Acoustic Current Meters
The RCM 9 and RCM 11 are acoustic Doppler backscatter-based current meters. Its basic way of operation is to emit an acoustic pulse and measure the frequency shift of any incoming reflection. These...(read more)
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Single Point Current Measurements: Using the Right Instrument in the Right Place (.pdf)
Fieldwork in aquatic environments normally requires considerable logistics, careful preparations before and substantial data treatment after an "expedition". Therefore it is imperative that...(read more)
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Single Point Current Measurements: Using the Right Instrument in the Right Place
Fieldwork in aquatic environments normally requires considerable logistics, careful preparations before and substantial data treatment after an "expedition". Therefore it is imperative that...(read more)
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High flux backscattering spectrometer (HFBS) High Flux Backscattering Spectrometer Home Backscattering Links CHRNS Disclaimer |
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Ultrasonic Backscattering Using Digitized Full-Waveform... Ultrasonic Backscattering Using Digitized Full-Waveform Scanning Technique Schuster, J Dipl, Ing., Institut für Verbundwerkstoffe, Universität See ASTM International Information |
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Nondestructive Evaluation of Fiber-Reinforced Composites with... Experimental studies of acoustic backscattering in the Rayleigh region (0.1 ? ka ? 1.0) from fiber-reinforced composites were conducted. See ASTM International Information |
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Grazing Angle Enhanced Backscattering from a Dielectric Film... Grazing Angle Enhanced Backscattering from a Dielectric Film on a Reflecting Metal Substrate See Storming Media LLC Information |
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Physical Scale Modeling the Millimeter-Wave Backscattering... Physical Scale Modeling the Millimeter-Wave Backscattering Behavior of Ground Clutter See Storming Media LLC Information |
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Amazon.com: "coherent backscattering peak": Key Phrase page "coherent backscattering peak" Learn more about Key Phrases Featured Books for "coherent backscattering peak" See Amazon.com Information |
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Electron Backscattering - What does EBS stand for? Acronyms... (redirected from Electron Backscattering) Electron Backscattering EBS Econotel Business Systems, Inc. |
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UC Oil The Gamma-Ray Backscattering from ALS This example is from work by other authors performed at the ALS in LBNL. |
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Backscattering Source Distribution of Boreal Forest Canopies... Backscattering Source Distribution of Boreal Forest Canopies at C-Band Backscattering Source Distribution of Boreal Forest Canopies at C-Band |
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[No Title] Modelled polarimetric backscattering response from single pine trees and pine canopies |
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