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Products/Services for backscatter
X-ray diffraction instruments are used to measure crystal structure, grain size, texture and/or residual stress of materials and compounds through interaction of the X-ray beam with a sample. Search by Specification | Learn More about X-ray Diffraction Instruments
Fiber optic probes collect light or spectra from extreme environments inside reaction vessels at high temperatures or pressures. Product types include UV-Vis spectroscopy probes, Raman spectroscopy probes, and refractometry probes. Search by Specification | Learn More about Fiber Optic Probes
Optical isolators are passive optical devices that allow light to be transmitted in only one direction. They are most often used to prevent any light from reflecting back down the fiber, as this light would enter the source and cause backscattering... Search by Specification | Learn More about Optical Isolators
Instruments such as quartz crystal microbalance (QCM) monitors, ellipsometers, RHEED systems, imaging stations, CD-SEMs, ion mills, C-V systems specifically designed for wafer metrology or in-situ monitoring of thin film parameters during thin film or semiconductors wafer processing. Search by Specification | Learn More about Wafer and Thin Film Instrumentation
Semiconductor metrology instruments are designed for wafer and thin film in-line inspection after semiconductor processing. They include capacitance gages, C-V systems, electron beam probes, ellipsometers, interferometers, I-V system, magnetometers, optical systems, profilometers, reflectometers, resistance probes, RHEED systems, and X-ray diffractometers. Search by Specification | Learn More about Semiconductor Metrology Instruments
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SE-Series Environmental Test Chambers Thermotron Industries
VTM Rheometer Dynisco Plastics
EnviroCam for Use in PAT EnvirOptics
Optical Measurement & Analysis EnvirOptics
The SPECTester Material Flow Solutions, Inc.
WACO Seam Saw for Food Cans Wilkens-Anderson Company
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Product News for backscatter
The Proven Test Method for Many Applications
Beta Backscatter method offers a great deal of versatility and can be used to measure: paint, oil, lubricating films, plastic, enamel, ceramic and phosphate coatings on metals and some non-metals. Also metal coatings on other metals, including some coatings too thick for X-ray test methods. (read more)
Plastic Coated Silica/Silica (Low OH)
When looking for a high quality fiber with superior transmission and a numerical aperture (N.A.) of 0.22 for efficient light coupling, the Anhydroguide™ AFS is the fiber of choice. The Anhydroguide™ fiber is drawn from preforms manufactured by the Plasma Outside Deposition (POD) process. (read more)
Plastic Coated Silica/Silica (Standard OH)
When looking for a high quality fiber with superior transmission and a numerical aperture (N.A.) of 0.22 for efficient light coupling, the Superguide™ SFS is the fiber of choice. The Superguide™ fiber is drawn from preforms manufactured by the Plasma Outside Deposition (POD) process. (read more)
Multi Measurement System for NDT
FISCHERSCOPE® MMS® PCB: Three in one instrument A universal measurement system for pc-boards measures the thicknesses of solder resist coatings as well as copper on surface areas and in boreholes. (read more)
DUALSCOPE® FMP40
DUALSCOPE® FMP40 is designed with built-in measurement reporting to meet the requirements set forth by SSPC-PA2 and IMO PSPC (read more)
X-ray Spectrometer for Quantitative Analysis
X-Ray Fluorescence Instruments for WEEE/RoHS by Fischer Technology The FISCHERSCOPE X-RAY XAN and XDAL identify the content of prohibited metals in compliance to the EU directive RoHS/WEEE (read more)
Solutions for Consumer Protection Safety Act
The FISCHERSCOPE® X-RAY XDV®-SD X-ray fluorescence spectrometer supports the challenges that manufacturers face while screening for hazardous substances per the Consumer Product Improvement Safety Act of 2008. (read more)
Conduct Research
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Hitachi Backscatter Detector for S-3000 Series SEMs
Backscattered Electron Detector Secondary electron images are the most frequently obtained images from the SEM. However, the backscattered electron (BSE) image provides important information and in...(read more)
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Passive RFID Basics
Radio Frequency Identification (RFID) systems use radio frequency to identify, locate and track people, assets, and animals. Passive RFID systems are composed of three components an interrogator...(read more)
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Explanation of the Principles Used in Single Point Acoustic Current Meters
The RCM 9 and RCM 11 are acoustic Doppler backscatter-based current meters. Its basic way of operation is to emit an acoustic pulse and measure the frequency shift of any incoming reflection. These...(read more)
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Single Point Current Measurements: Using the Right Instrument in the Right Place (.pdf)
Fieldwork in aquatic environments normally requires considerable logistics, careful preparations before and substantial data treatment after an "expedition". Therefore it is imperative that...(read more)
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Single Point Current Measurements: Using the Right Instrument in the Right Place
Fieldwork in aquatic environments normally requires considerable logistics, careful preparations before and substantial data treatment after an "expedition". Therefore it is imperative that...(read more)
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Rad-icon Röntgensensoren und Kameras, Micofocus Röntgenröhren,... Industriemessgeräte auf Röntgenbasis (Digitales Röntgen, Röntgenfluoreszenz, Compton-Backscatter ...) |
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What is imaging radar ?/jpl Radar transmits a pulse Measures reflected echo (backscatter ) |
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Airborne circum-Pacific aerosol backscatter surveys The Airborne Backscatter Lidar (ABL) was commissioned in the late 1980s for deployment aboard the NASA Dryden Flight Research Center DC-8 Airborne |
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HowStuffWorks "Do backscatter X-ray systems pose a risk to... Do "backscatter" X-ray systems pose a risk to frequent fliers? "Do "backscatter" X-ray systems pose a risk to frequent fliers?." 27 February 2007. |
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Backscatter interrogators, communication systems and... Backscatter interrogators, communication systems and backscatter communication methods -> Monitor Keywords |
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Backscatter interrogator reception method and interrogator for... Backscatter interrogator reception method and interrogator for a modulated backscatter system -> Monitor Keywords |
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Weather Effects on Radar Backscatter from Crops Abstract: Weather Effects on Radar Backscatter from Crops Weather Effects on Radar Backscatter from Crops |
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ORBITAL EFFECTS ON ERS-1 SAR TEMPORAL BACKSCATTER PROFILES OF... Orbital Effects on ERS-1 SAR Temporal Backscatter Profiles of Agricultural Crops |
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IBM Technical Journals are several critical sources of error: backscatter speckle, beamwidth distortion, and cross-coupling artifacts between attenuation and backscatter. |
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ASTM B567 -98(2003) Standard Test Method for Measurement of... ASTM B567 - 98(2003) Standard Test Method for Measurement of Coating Thickness by the Beta Backscatter Method See ASTM International Information |
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