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Product News for Å:Angstrom
Wyko NT9100 Optical Profiler
The new bench-top Wyko NT9100 Optical Profiling System shares many of the performance attributes of the larger ninth-generation NT9000 systems, including: easy measurement setup, fast data acquisition, comprehensible and extensible data analysis, and angstrom-level repeatability. (read more)
Avantes Multi-Layer Thin Film Solution
Avantes is pleased to announce a partnership with Angstrom Sun Technologies of Acton, MA for the resale of their TFProbe multi-layer thin film software along with select thin film metrology systems for the UV/VIS and NIR. (read more)
Surface Metrology Service Applications
The Surface Metrology Laboratory, located at Arnprior Rapid Manufacturing Solutions, houses the latest in 2D and 3D surface measurement and mapping instrumentation, customized profilometry software, and surface metrology expertise, (read more)
TriTec MSF-Tri-Technology Multi-Spectral Finishing
ELCAN Optical Technologies has created a very powerful and proprietary solution for the most demanding multi-spectral optical requirements! Are your broadband optical requirements pushing you towards expensive solutions like polished Beryllium and Silicon Carbide mirrors and assemblies? (read more)
Dektak 8
Advanced stylus profiler system delivers high repeatability, low-force sensor technology and advanced 3D data analysis for surface characterization of MEMS and thin & thick films. (read more)
Conduct Research
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3D MEMS Metrology with Optical Profilers
Faster product development and reduced time-to-market have made optical surface profilers essential tools for three-dimensional metrology of MEMS. The Veeco Instruments Wyko® NT Series Optical...(read more)
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Foreline Traps
Molecular sieve traps containing type 13X synthetic zeolite effectively prevent oil backstreaming and trap water vapors at room temperature.Type 13X zeolite will adsorb molecules with critical...(read more)
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Metal Measurement Conversion Utility
This utility gives the user the ability to convert Length, Area, Volume, Weight and temperature into the various measurement systems from around the world. From metric to English measurements and also...(read more)
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Practical Advice on the Determinaton of Cantilever Spring Constants (AN94)
Atomic force microscopy (AFM) is being used in a great variety of force measurement applications, including investigating the unfolding pathways of native membrane proteins2, probing the structure of...(read more)
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Probing Nano-Scale Forces with the Atomic Force Microscope (AN08)
The ability of the atomic force microscope (AFM) to create three-dimensional micrographs with resolution down to the nanometer and Angstrom scales has made it an essential tool for imaging surfaces in...(read more)
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Geometric Considerations of Surface Profilers and Pivoting Step Measurers (AN518)
In recent years, stylus-based surface measuring instruments have broadened in application to become among the most widely used general purpose instruments in advanced R&D and manufacturing. These...(read more)
